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Progress in pattern recognition, image analysis, computer vision, and applications20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Progress in pattern recognition, image analysis, computer vision, and applicationsedited by Alvaro Pardo, Josef Kittler.
Reminder of title:	20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
remainder title:	CIARP 2015
other author:	Pardo, Alvaro.
corporate name:
Published:	Cham :Springer International Publishing :2015.
Description:	xxi, 787 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Pattern recognition systemsCongresses.
Online resource:	http://dx.doi.org/10.1007/978-3-319-25751-8
ISBN:	9783319257518$q(electronic bk.)

Progress in pattern recognition, image analysis, computer vision, and applications20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
Progress in pattern recognition, image analysis, computer vision, and applications20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /[electronic resource] :CIARP 2015edited by Alvaro Pardo, Josef Kittler. - Cham :Springer International Publishing :2015. - xxi, 787 p. :ill., digital ;24 cm. - Lecture notes in computer science,94230302-9743 ;. - Lecture notes in computer science ;4891..

This book constitutes the refereed proceedings of the 20th Iberoamerican Congress on Pattern Recognition, CIARP 2015, held in Montevideo, Uruguay, in November 2015. The 95 papers presented were carefully reviewed and selected from 185 submissions. The papers are organized in topical sections on applications on pattern recognition; biometrics; computer vision; gesture recognition; image classification and retrieval; image coding, processing and analysis; segmentation, analysis of shape and texture; signals analysis and processing; theory of pattern recognition; video analysis, segmentation and tracking.

ISBN: 9783319257518$q(electronic bk.)

Standard No.: 10.1007/978-3-319-25751-8doiSubjects--Topical Terms:

387176
Pattern recognition systems
--Congresses.

LC Class. No.: Q337.5

Dewey Class. No.: 006.4

Progress in pattern recognition, image analysis, computer vision, and applications20th Iberoamerican Congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015 : proceedings /
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