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The source/drain engineering of nano...
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Li, Zhiqiang.
The source/drain engineering of nanoscale Germanium-based MOS devices
Record Type:
Electronic resources : Monograph/item
Title/Author:
The source/drain engineering of nanoscale Germanium-based MOS devicesby Zhiqiang Li.
Author:
Li, Zhiqiang.
Published:
Berlin, Heidelberg :Springer Berlin Heidelberg :2016.
Description:
xiv, 59 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Metal oxide semiconductor field-effect transistors.
Online resource:
http://dx.doi.org/10.1007/978-3-662-49683-1
ISBN:
9783662496831$q(electronic bk.)
The source/drain engineering of nanoscale Germanium-based MOS devices
Li, Zhiqiang.
The source/drain engineering of nanoscale Germanium-based MOS devices
[electronic resource] /by Zhiqiang Li. - Berlin, Heidelberg :Springer Berlin Heidelberg :2016. - xiv, 59 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..
Introduction -- Ge-based Schottky barrier height modulation technology -- Metal germanide technology -- Contact resistance of Ge-based devices -- Conclusions.
ISBN: 9783662496831$q(electronic bk.)
Standard No.: 10.1007/978-3-662-49683-1doiSubjects--Topical Terms:
221791
Metal oxide semiconductor field-effect transistors.
LC Class. No.: TK7871.95
Dewey Class. No.: 621.38152
The source/drain engineering of nanoscale Germanium-based MOS devices
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Introduction -- Ge-based Schottky barrier height modulation technology -- Metal germanide technology -- Contact resistance of Ge-based devices -- Conclusions.
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EB TK7871.95 L693 2016
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http://dx.doi.org/10.1007/978-3-662-49683-1
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