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X-ray scattering from semiconductors...

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Fewster, Paul F.

X-ray scattering from semiconductors and other materials

Record Type:	Electronic resources : Monograph/item
Title/Author:	X-ray scattering from semiconductors and other materialsPaul F. Fewster.
Author:	Fewster, Paul F.
Published:	New Jersey :World Scientific,2015.
Description:	1 online resource (xvi, 493 p.) :ill.
Subject:	X-raysScattering.
Online resource:	http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc
ISBN:	9789814436939 (electronic bk.)

X-ray scattering from semiconductors and other materials
Fewster, Paul F.

X-ray scattering from semiconductors and other materials[electronic resource] /Paul F. Fewster. - 3rd ed. - New Jersey :World Scientific,2015. - 1 online resource (xvi, 493 p.) :ill.

Includes bibliographical references (p. 475-476) and index.

An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.

ISBN: 9789814436939 (electronic bk.)

LCCN: 2014031060Subjects--Topical Terms:

229799
X-rays
--Scattering.

LC Class. No.: QC482.S3 / F49 2015

Dewey Class. No.: 537.5/35

X-ray scattering from semiconductors and other materials
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008 161104s2015 njua ob 001 0 eng c
010 $a 2014031060
020 $a 9789814436939 (electronic bk.)
020 $z 9789814436922 (hbk.)
035 $a 18337391
040 $a OU/DLC $b eng $c OU $d DLC
050 0 0 $a QC482.S3 $b F49 2015
082 0 0 $a 537.5/35 $2 23
100 1 $a Fewster, Paul F. $3 237731
245 1 0 $a X-ray scattering from semiconductors and other materials $h [electronic resource] / $c Paul F. Fewster.
250 $a 3rd ed.
260 $a New Jersey : $b World Scientific, $c 2015.
300 $a 1 online resource (xvi, 493 p.) : $b ill.
504 $a Includes bibliographical references (p. 475-476) and index.
505 0 $a An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
588 $a Description based on print version record.
650 0 $a X-rays $x Scattering. $3 229799
650 0 $a Semiconductors. $3 182134
856 4 0 $u http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc

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000000124841

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EB QC482.S3 F432 2015

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1 records • Pages 1 •
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http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc

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