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CMOS RF circuit design for reliabili...

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CMOS RF circuit design for reliability and variability

Record Type:	Electronic resources : Monograph/item
Title/Author:	CMOS RF circuit design for reliability and variabilityby Jiann-Shiun Yuan.
Author:	Yuan, Jiann-Shiun.
Published:	Singapore :Springer Singapore :2016.
Description:	vi, 106 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Radio frequency integrated circuitsDesign and construction.
Online resource:	http://dx.doi.org/10.1007/978-981-10-0884-9
ISBN:	9789811008849$q(electronic bk.)

CMOS RF circuit design for reliability and variability
Yuan, Jiann-Shiun.

CMOS RF circuit design for reliability and variability[electronic resource] /by Jiann-Shiun Yuan. - Singapore :Springer Singapore :2016. - vi, 106 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

ISBN: 9789811008849$q(electronic bk.)

Standard No.: 10.1007/978-981-10-0884-9doiSubjects--Topical Terms:

246584
Radio frequency integrated circuits
--Design and construction.

LC Class. No.: TK7874.78

Dewey Class. No.: 621.3815

CMOS RF circuit design for reliability and variability
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490 1 $a SpringerBriefs in applied sciences and technology, $x 2191-530X
505 0 $a CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
520 $a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
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