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Metrology and physical mechanisms in...

Celano, Umberto.

Metrology and physical mechanisms in new generation ionic devices

Record Type:	Electronic resources : Monograph/item
Title/Author:	Metrology and physical mechanisms in new generation ionic devicesby Umberto Celano.
Author:	Celano, Umberto.
Published:	Cham :Springer International Publishing :2016.
Description:	xxiv, 175 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Thin films.
Online resource:	http://dx.doi.org/10.1007/978-3-319-39531-9
ISBN:	9783319395319$q(electronic bk.)

Metrology and physical mechanisms in new generation ionic devices
Celano, Umberto.

Metrology and physical mechanisms in new generation ionic devices[electronic resource] /by Umberto Celano. - Cham :Springer International Publishing :2016. - xxiv, 175 p. :ill. (some col.), digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

ISBN: 9783319395319$q(electronic bk.)

Standard No.: 10.1007/978-3-319-39531-9doiSubjects--Topical Terms:

203678
Thin films.

LC Class. No.: QC176.83

Dewey Class. No.: 621.38152

Metrology and physical mechanisms in new generation ionic devices
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245 1 0 $a Metrology and physical mechanisms in new generation ionic devices $h [electronic resource] / $c by Umberto Celano.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2016.
300 $a xxiv, 175 p. : $b ill. (some col.), digital ; $c 24 cm.
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505 0 $a Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
520 $a The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
650 0 $a Thin films. $3 203678
650 0 $a Electronic apparatus and appliances. $3 182369
650 0 $a Metrology. $3 486307
650 0 $a Nonvolatile random-access memory. $3 680408
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650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Nanotechnology and Microengineering. $3 348421
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
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