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Transmission electron microscopydiff...

Carter, C. Barry.

Transmission electron microscopydiffraction, imaging, and spectrometry /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Transmission electron microscopyedited by C. Barry Carter, David B. Williams.
Reminder of title:	diffraction, imaging, and spectrometry /
other author:	Carter, C. Barry.
Published:	Cham :Springer International Publishing :2016.
Description:	xxxiii, 518 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Transmission electron microscopy.
Online resource:	http://dx.doi.org/10.1007/978-3-319-26651-0
ISBN:	9783319266510$q(electronic bk.)

Transmission electron microscopydiffraction, imaging, and spectrometry /
Transmission electron microscopydiffraction, imaging, and spectrometry /[electronic resource] :edited by C. Barry Carter, David B. Williams. - Cham :Springer International Publishing :2016. - xxxiii, 518 p. :ill., digital ;24 cm.

Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.

ISBN: 9783319266510$q(electronic bk.)

Standard No.: 10.1007/978-3-319-26651-0doiSubjects--Topical Terms:

192825
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

Transmission electron microscopydiffraction, imaging, and spectrometry /
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245 0 0 $a Transmission electron microscopy $h [electronic resource] : $b diffraction, imaging, and spectrometry / $c edited by C. Barry Carter, David B. Williams.
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300 $a xxxiii, 518 p. : $b ill., digital ; $c 24 cm.
505 0 $a Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
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650 1 4 $a Materials Science. $3 273697
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
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650 2 4 $a Spectroscopy/Spectrometry. $3 375491
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650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Continuum Mechanics and Mechanics of Materials. $3 273691
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