VLSI-SoCdesign for reliability, secu...
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  • VLSI-SoCdesign for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : revised selected papers /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: VLSI-SoCedited by Youngsoo Shin ... [et al.].
    Reminder of title: design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : revised selected papers /
    remainder title: VLSI-SoC 2015
    other author: Shin, Youngsoo.
    corporate name:
    Published: Cham :Springer International Publishing :2016.
    Description: xiii, 223 p. :ill., digital ;24 cm.
    Contained By: Springer eBooks
    Subject: Internet of thingsCongresses.
    Online resource: http://dx.doi.org/10.1007/978-3-319-46097-0
    ISBN: 9783319460970$q(electronic bk.)
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