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Ultra low noise CMOS image sensors
~
Boukhayma, Assim.
Ultra low noise CMOS image sensors
Record Type:
Electronic resources : Monograph/item
Title/Author:
Ultra low noise CMOS image sensorsby Assim Boukhayma.
Author:
Boukhayma, Assim.
Published:
Cham :Springer International Publishing :2018.
Description:
xiv, 180 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Metal oxide semiconductors, Complementary.
Online resource:
http://dx.doi.org/10.1007/978-3-319-68774-2
ISBN:
9783319687742$q(electronic bk.)
Ultra low noise CMOS image sensors
Boukhayma, Assim.
Ultra low noise CMOS image sensors
[electronic resource] /by Assim Boukhayma. - Cham :Springer International Publishing :2018. - xiv, 180 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..
Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
ISBN: 9783319687742$q(electronic bk.)
Standard No.: 10.1007/978-3-319-68774-2doiSubjects--Topical Terms:
184467
Metal oxide semiconductors, Complementary.
LC Class. No.: TK7871.99.M44
Dewey Class. No.: 621.367
Ultra low noise CMOS image sensors
LDR
:02274nmm a2200337 a 4500
001
529324
003
DE-He213
005
20180719105041.0
006
m d
007
cr nn 008maaau
008
181105s2018 gw s 0 eng d
020
$a
9783319687742$q(electronic bk.)
020
$a
9783319687735$q(paper)
024
7
$a
10.1007/978-3-319-68774-2
$2
doi
035
$a
978-3-319-68774-2
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7871.99.M44
072
7
$a
TJF
$2
bicssc
072
7
$a
TEC008000
$2
bisacsh
072
7
$a
TEC008070
$2
bisacsh
082
0 4
$a
621.367
$2
23
090
$a
TK7871.99.M44
$b
B762 2018
100
1
$a
Boukhayma, Assim.
$3
802336
245
1 0
$a
Ultra low noise CMOS image sensors
$h
[electronic resource] /
$c
by Assim Boukhayma.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2018.
300
$a
xiv, 180 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Springer theses,
$x
2190-5053
505
0
$a
Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
520
$a
This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
650
0
$a
Metal oxide semiconductors, Complementary.
$3
184467
650
0
$a
Image processing
$x
Digital techniques.
$3
182119
650
1 4
$a
Engineering.
$3
210888
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
274412
650
2 4
$a
Signal, Image and Speech Processing.
$3
273768
650
2 4
$a
Circuits and Systems.
$3
274416
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
830
0
$a
Springer theses.
$3
557607
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-68774-2
950
$a
Engineering (Springer-11647)
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