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Swift ion beam analysis in nanosciences

Chabli, Amal.

Swift ion beam analysis in nanosciences

Record Type:	Electronic resources : Monograph/item
Title/Author:	Swift ion beam analysis in nanosciencesDenis Jalabert, Ian Vickridge, Amal Chabli.
Author:	Jalabert, Denis.
other author:	Vickridge, Ian,
Published:	London, UK :ISTE ;2017.
Description:	1 online resource.
Subject:	Ion bombardmentIndustrial applications.
Online resource:	https://onlinelibrary.wiley.com/doi/book/10.1002/9781119005063
ISBN:	9781119005063$q(electronic bk.)

Swift ion beam analysis in nanosciences
Jalabert, Denis.

Swift ion beam analysis in nanosciences[electronic resource] /Denis Jalabert, Ian Vickridge, Amal Chabli. - 1st ed. - London, UK :ISTE ;2017. - 1 online resource. - Nanoscience and nanotechnology series. - RSC nanoscience & nanotechnology..

Includes list of acronyms, bibliographical references (p. 237-255) and index.

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods. -- ISTE, Ltd. website.

ISBN: 9781119005063$q(electronic bk.)Subjects--Topical Terms:

280954
Ion bombardment
--Industrial applications.

LC Class. No.: QC702.7.B65

Dewey Class. No.: 539.7/3

Swift ion beam analysis in nanosciences
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245 1 0 $a Swift ion beam analysis in nanosciences $h [electronic resource] / $c Denis Jalabert, Ian Vickridge, Amal Chabli.
250 $a 1st ed.
260 $a London, UK : $b ISTE ; $a Hoboken, NJ : $b John Wiley & Sons, $c 2017.
300 $a 1 online resource.
490 1 $a Nanoscience and nanotechnology series
504 $a Includes list of acronyms, bibliographical references (p. 237-255) and index.
520 $a Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods. -- ISTE, Ltd. website.
588 0 $a Online resource; title from PDF title page (viewed August 29, 2017)
650 0 $a Ion bombardment $x Industrial applications. $3 280954
650 0 $a Nanotechnology. $3 193873
700 1 $a Vickridge, Ian, $d 1958- $3 814078
700 1 $a Chabli, Amal. $3 814079
830 0 $a RSC nanoscience & nanotechnology. $3 814080
856 4 0 $u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119005063