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Swift ion beam analysis in nanosciences

Chabli, Amal.

Swift ion beam analysis in nanosciences

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Swift ion beam analysis in nanosciencesDenis Jalabert, Ian Vickridge, Amal Chabli.
作者:	Jalabert, Denis.
其他作者:	Vickridge, Ian,
出版者:	London, UK :ISTE ;2017.
面頁冊數:	1 online resource.
標題:	Ion bombardmentIndustrial applications.
電子資源:	https://onlinelibrary.wiley.com/doi/book/10.1002/9781119005063
ISBN:	9781119005063$q(electronic bk.)

Swift ion beam analysis in nanosciences
Jalabert, Denis.

Swift ion beam analysis in nanosciences[electronic resource] /Denis Jalabert, Ian Vickridge, Amal Chabli. - 1st ed. - London, UK :ISTE ;2017. - 1 online resource. - Nanoscience and nanotechnology series. - RSC nanoscience & nanotechnology..

Includes list of acronyms, bibliographical references (p. 237-255) and index.

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods. -- ISTE, Ltd. website.

ISBN: 9781119005063$q(electronic bk.)Subjects--Topical Terms:

280954
Ion bombardment
--Industrial applications.

LC Class. No.: QC702.7.B65

Dewey Class. No.: 539.7/3

Swift ion beam analysis in nanosciences
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