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Timing performance of nanometer digi...

Champac, Victor.

Timing performance of nanometer digital circuits under process variations

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Timing performance of nanometer digital circuits under process variationsby Victor Champac, Jose Garcia Gervacio.
作者:	Champac, Victor.
其他作者:	Garcia Gervacio, Jose.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xviii, 185 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	NanoelectronicsMaterials.
電子資源:	http://dx.doi.org/10.1007/978-3-319-75465-9
ISBN:	9783319754659$q(electronic bk.)

Timing performance of nanometer digital circuits under process variations
Champac, Victor.

Timing performance of nanometer digital circuits under process variations[electronic resource] /by Victor Champac, Jose Garcia Gervacio. - Cham :Springer International Publishing :2018. - xviii, 185 p. :ill., digital ;24 cm. - Frontiers in electronic testing,v.390929-1296 ;. - Frontiers in electronic testing ;v.39..

Introduction -- Mathematical Fundamentals -- Process Variations -- Gate delay under process variations -- Path Delay Under Process Variations -- Circuit Analysis under Process Variations -- FinFET Technology and design issues.

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level "design hints" are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

ISBN: 9783319754659$q(electronic bk.)

Standard No.: 10.1007/978-3-319-75465-9doiSubjects--Topical Terms:

561110
Nanoelectronics
--Materials.

LC Class. No.: TK7874.84 / .C436 2018

Dewey Class. No.: 621.3815

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