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A beginners' guide to scanning elect...
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A beginners' guide to scanning electron microscopy
Record Type:
Electronic resources : Monograph/item
Title/Author:
A beginners' guide to scanning electron microscopyby Anwar Ul-Hamid.
Author:
Ul-Hamid, Anwar.
Published:
Cham :Springer International Publishing :2018.
Description:
xxii, 402 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Scanning electron microscopy.
Online resource:
https://doi.org/10.1007/978-3-319-98482-7
ISBN:
9783319984827$q(electronic bk.)
A beginners' guide to scanning electron microscopy
Ul-Hamid, Anwar.
A beginners' guide to scanning electron microscopy
[electronic resource] /by Anwar Ul-Hamid. - Cham :Springer International Publishing :2018. - xxii, 402 p. :ill., digital ;24 cm.
Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation.
ISBN: 9783319984827$q(electronic bk.)
Standard No.: 10.1007/978-3-319-98482-7doiSubjects--Topical Terms:
242518
Scanning electron microscopy.
LC Class. No.: QH212.S3 / U443 2018
Dewey Class. No.: 502.825
A beginners' guide to scanning electron microscopy
LDR
:01111nmm a2200313 a 4500
001
545565
003
DE-He213
005
20190321172629.0
006
m d
007
cr nn 008maaau
008
190530s2018 gw s 0 eng d
020
$a
9783319984827$q(electronic bk.)
020
$a
9783319984810$q(paper)
024
7
$a
10.1007/978-3-319-98482-7
$2
doi
035
$a
978-3-319-98482-7
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
QH212.S3
$b
U443 2018
072
7
$a
TGMT
$2
bicssc
072
7
$a
TEC021000
$2
bisacsh
072
7
$a
TGMT
$2
thema
082
0 4
$a
502.825
$2
23
090
$a
QH212.S3
$b
U36 2018
100
1
$a
Ul-Hamid, Anwar.
$3
824558
245
1 2
$a
A beginners' guide to scanning electron microscopy
$h
[electronic resource] /
$c
by Anwar Ul-Hamid.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2018.
300
$a
xxii, 402 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation.
650
0
$a
Scanning electron microscopy.
$3
242518
650
1 4
$a
Characterization and Evaluation of Materials.
$3
273978
650
2 4
$a
Spectroscopy and Microscopy.
$3
376485
650
2 4
$a
Nanotechnology and Microengineering.
$3
348421
650
2 4
$a
Biological Microscopy.
$3
273937
650
2 4
$a
Nanotechnology.
$3
193873
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
856
4 0
$u
https://doi.org/10.1007/978-3-319-98482-7
950
$a
Chemistry and Materials Science (Springer-11644)
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EB QH212.S3 U36 2018 2018
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