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Spectroscopic ellipsometry for photo...

Collins, Robert W.

Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization

Record Type:	Electronic resources : Monograph/item
Title/Author:	Spectroscopic ellipsometry for photovoltaics.edited by Hiroyuki Fujiwara, Robert W. Collins.
remainder title:	Fundamental principles and solar cell characterization
other author:	Fujiwara, Hiroyuki.
Published:	Cham :Springer International Publishing :2018.
Description:	xx, 594 p. :ill. (some color), digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Photovoltaic power generation.
Online resource:	https://doi.org/10.1007/978-3-319-75377-5
ISBN:	9783319753775$q(electronic bk.)

Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization
Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization[electronic resource] /Fundamental principles and solar cell characterizationedited by Hiroyuki Fujiwara, Robert W. Collins. - Cham :Springer International Publishing :2018. - xx, 594 p. :ill. (some color), digital ;24 cm. - Springer series in optical sciences,v.2120342-4111 ;. - Springer series in optical sciences ;v. 93..

Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

ISBN: 9783319753775$q(electronic bk.)

Standard No.: 10.1007/978-3-319-75377-5doiSubjects--Topical Terms:

184746
Photovoltaic power generation.

LC Class. No.: QC443 / .S643 2018

Dewey Class. No.: 620.11295

Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization
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505 0 $a Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
520 $a This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
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