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Structural, syntactic, and statistic...

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Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Structural, syntactic, and statistical pattern recognitionedited by Xiao Bai ... [et al.].
Reminder of title:	Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /
remainder title:	S+SSPR 2018
other author:	Bai, Xiao.
corporate name:
Published:	Cham :Springer International Publishing :2018.
Description:	xiii, 524 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Pattern perceptionCongresses.
Online resource:	https://doi.org/10.1007/978-3-319-97785-0
ISBN:	9783319977850$q(electronic bk.)

Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /
Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /[electronic resource] :S+SSPR 2018edited by Xiao Bai ... [et al.]. - Cham :Springer International Publishing :2018. - xiii, 524 p. :ill., digital ;24 cm. - Lecture notes in computer science,110040302-9743 ;. - Lecture notes in computer science ;4891..

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.

ISBN: 9783319977850$q(electronic bk.)

Standard No.: 10.1007/978-3-319-97785-0doiSubjects--Topical Terms:

387175
Pattern perception
--Congresses.

LC Class. No.: Q327 / .S67 2018

Dewey Class. No.: 006.3

Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /
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