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Thermal conductivity measurements in...
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Kasirga, T. Serkan.
Thermal conductivity measurements in atomically thin materials and devices
Record Type:
Electronic resources : Monograph/item
Title/Author:
Thermal conductivity measurements in atomically thin materials and devicesby T. Serkan Kasirga.
Author:
Kasirga, T. Serkan.
Published:
Singapore :Springer Singapore :2020.
Description:
xv, 50 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Thin filmsThermal properties.
Online resource:
https://doi.org/10.1007/978-981-15-5348-6
ISBN:
9789811553486$q(electronic bk.)
Thermal conductivity measurements in atomically thin materials and devices
Kasirga, T. Serkan.
Thermal conductivity measurements in atomically thin materials and devices
[electronic resource] /by T. Serkan Kasirga. - Singapore :Springer Singapore :2020. - xv, 50 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology. - SpringerBriefs in applied sciences and technology..
Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.
This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.
ISBN: 9789811553486$q(electronic bk.)
Standard No.: 10.1007/978-981-15-5348-6doiSubjects--Topical Terms:
869130
Thin films
--Thermal properties.
LC Class. No.: TA418.9.T45 / K375 2020
Dewey Class. No.: 620.11
Thermal conductivity measurements in atomically thin materials and devices
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Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.
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This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.
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EB TA418.9.T45 K19 2020 2020
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1 records • Pages 1 •
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https://doi.org/10.1007/978-981-15-5348-6
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