國立高雄大學圖資館 |

Language: English

Back

Introduction to statistics in metrology

Crowder, Stephen.

Introduction to statistics in metrology

Record Type:	Electronic resources : Monograph/item
Title/Author:	Introduction to statistics in metrologyby Stephen Crowder ... [et al.].
other author:	Crowder, Stephen.
Published:	Cham :Springer International Publishing :2020.
Description:	xxi, 347 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	MetrologyStatistical methods.
Online resource:	https://doi.org/10.1007/978-3-030-53329-8
ISBN:	9783030533298$q(electronic bk.)

Introduction to statistics in metrology
Introduction to statistics in metrology[electronic resource] /by Stephen Crowder ... [et al.]. - Cham :Springer International Publishing :2020. - xxi, 347 p. :ill., digital ;24 cm.

1. Introduction -- 2. Basic Concepts -- 3. The International System of Units (SI), Traceability, and Calibration -- 4. Introduction to Statistics and Probability -- 5. Measurement Uncertainty in Decision Making -- 6. The Measurement Model and Uncertainty -- 7. Analytical Methods for the Propagation of Uncertainties -- 8. Monte Carlo Methods for the Propagation of Uncertainties -- 9. Determining Uncertainties in Fitted Curves -- 10. Design of Experiments in Metrology -- 11. Special Topics in Metrology -- 12. Summary and Acknowledgments.

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE) The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.

ISBN: 9783030533298$q(electronic bk.)

Standard No.: 10.1007/978-3-030-53329-8doiSubjects--Topical Terms:

881636
Metrology
--Statistical methods.

LC Class. No.: QA465

Dewey Class. No.: 530.8

Introduction to statistics in metrology
LDR:02667nmm a2200325 a 4500 001 589664
003 DE-He213
005 20210311140126.0
006 m d
007 cr nn 008maaau
008 210601s2020 sz s 0 eng d
020 $a 9783030533298$q(electronic bk.)
020 $a 9783030533281$q(paper)
024 7 $a 10.1007/978-3-030-53329-8 $2 doi
035 $a 978-3-030-53329-8
040 $a GP $c GP
041 0 $a eng
050 4 $a QA465
072 7 $a PBT $2 bicssc
072 7 $a MAT029000 $2 bisacsh
072 7 $a PBT $2 thema
082 0 4 $a 530.8 $2 23
090 $a QA465 $b .I61 2020
245 0 0 $a Introduction to statistics in metrology $h [electronic resource] / $c by Stephen Crowder ... [et al.].
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a xxi, 347 p. : $b ill., digital ; $c 24 cm.
505 0 $a 1. Introduction -- 2. Basic Concepts -- 3. The International System of Units (SI), Traceability, and Calibration -- 4. Introduction to Statistics and Probability -- 5. Measurement Uncertainty in Decision Making -- 6. The Measurement Model and Uncertainty -- 7. Analytical Methods for the Propagation of Uncertainties -- 8. Monte Carlo Methods for the Propagation of Uncertainties -- 9. Determining Uncertainties in Fitted Curves -- 10. Design of Experiments in Metrology -- 11. Special Topics in Metrology -- 12. Summary and Acknowledgments.
520 $a This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE) The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
650 0 $a Metrology $x Statistical methods. $3 881636
650 0 $a Measurement $x Mathematical models. $3 712097
650 1 4 $a Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences. $3 348605
650 2 4 $a Measurement Science and Instrumentation. $3 376366
650 2 4 $a Statistical Theory and Methods. $3 274054
650 2 4 $a Electrical Engineering. $3 338706
650 2 4 $a Mechanical Engineering. $3 273894
700 1 $a Crowder, Stephen. $3 881635
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-030-53329-8
950 $a Mathematics and Statistics (SpringerNature-11649)