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Machine learning, optimization, and ...
~
(1998 :)
Machine learning, optimization, and data science6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020 : revised selected papers.Part II /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Machine learning, optimization, and data scienceedited by Giuseppe Nicosia ... [et al.].
Reminder of title:
6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020 : revised selected papers.
remainder title:
LOD 2020
other author:
Nicosia, Giuseppe.
corporate name:
Published:
Cham :Springer International Publishing :2020.
Description:
xxxviii, 666 p. :ill., digital ;24 cm.
Contained By:
Springer Nature eBook
Subject:
Machine learningCongresses.
Online resource:
https://doi.org/10.1007/978-3-030-64580-9
ISBN:
9783030645809$q(electronic bk.)
Machine learning, optimization, and data science6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020 : revised selected papers.Part II /
Machine learning, optimization, and data science
6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020 : revised selected papers.Part II /[electronic resource] :LOD 2020edited by Giuseppe Nicosia ... [et al.]. - Cham :Springer International Publishing :2020. - xxxviii, 666 p. :ill., digital ;24 cm. - Lecture notes in computer science,125660302-9743 ;. - Lecture notes in computer science ;4891..
This two-volume set, LNCS 12565 and 12566, constitutes the refereed proceedings of the 6th International Conference on Machine Learning, Optimization, and Data Science, LOD 2020, held in Siena, Italy, in July 2020. The total of 116 full papers presented in this two-volume post-conference proceedings set was carefully reviewed and selected from 209 submissions. These research articles were written by leading scientists in the fields of machine learning, artificial intelligence, reinforcement learning, computational optimization, and data science presenting a substantial array of ideas, technologies, algorithms, methods, and applications.
ISBN: 9783030645809$q(electronic bk.)
Standard No.: 10.1007/978-3-030-64580-9doiSubjects--Topical Terms:
384498
Machine learning
--Congresses.
LC Class. No.: Q325.5
Dewey Class. No.: 006.31
Machine learning, optimization, and data science6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020 : revised selected papers.Part II /
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based on 0 review(s)
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000000192807
電子館藏
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EB Q325.5 .L821 2020 2020
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1 records • Pages 1 •
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https://doi.org/10.1007/978-3-030-64580-9
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