Soft error reliability of VLSI circu...
Ghavami, Behnam.

 

  • Soft error reliability of VLSI circuitsanalysis and mitigation techniques /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Soft error reliability of VLSI circuitsby Behnam Ghavami, Mohsen Raji.
    Reminder of title: analysis and mitigation techniques /
    Author: Ghavami, Behnam.
    other author: Raji, Mohsen.
    Published: Cham :Springer International Publishing :2021.
    Description: xiii, 114 p. :ill., digital ;24 cm.
    Contained By: Springer Nature eBook
    Subject: Integrated circuitsVery large scale integration.
    Online resource: https://doi.org/10.1007/978-3-030-51610-9
    ISBN: 9783030516109$q(electronic bk.)
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  • 1 records • Pages 1 •
 
000000193752 電子館藏 1圖書 電子書 EB TK7888.4 .G411 2021 2021 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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