國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Soft error reliability of VLSI circu...

Ghavami, Behnam.

Soft error reliability of VLSI circuitsanalysis and mitigation techniques /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Soft error reliability of VLSI circuitsby Behnam Ghavami, Mohsen Raji.
其他題名:	analysis and mitigation techniques /
作者:	Ghavami, Behnam.
其他作者:	Raji, Mohsen.
出版者:	Cham :Springer International Publishing :2021.
面頁冊數:	xiii, 114 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Integrated circuitsVery large scale integration.
電子資源:	https://doi.org/10.1007/978-3-030-51610-9
ISBN:	9783030516109$q(electronic bk.)

Soft error reliability of VLSI circuitsanalysis and mitigation techniques /
Ghavami, Behnam.

Soft error reliability of VLSI circuitsanalysis and mitigation techniques /[electronic resource] :by Behnam Ghavami, Mohsen Raji. - Cham :Springer International Publishing :2021. - xiii, 114 p. :ill., digital ;24 cm.

Introduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Provides an accessible, comprehensive introduction to soft errors; Describes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuits; Includes state-of-the art soft error aware CAD algorithms; Describes practical soft error aware synthesis techniques for commercial large-scale VLSI designs.

ISBN: 9783030516109$q(electronic bk.)

Standard No.: 10.1007/978-3-030-51610-9doiSubjects--Topical Terms:

180020
Integrated circuits
--Very large scale integration.

LC Class. No.: TK7888.4 / .G43 2021

Dewey Class. No.: 621.3815

Soft error reliability of VLSI circuitsanalysis and mitigation techniques /
LDR:02981nmm a2200325 a 4500 001 595489
003 DE-He213
005 20201013193428.0
006 m d
007 cr nn 008maaau
008 211005s2021 sz s 0 eng d
020 $a 9783030516109$q(electronic bk.)
020 $a 9783030516093$q(paper)
024 7 $a 10.1007/978-3-030-51610-9 $2 doi
035 $a 978-3-030-51610-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7888.4 $b .G43 2021
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK7888.4 $b .G411 2021
100 1 $a Ghavami, Behnam. $3 887733
245 1 0 $a Soft error reliability of VLSI circuits $h [electronic resource] : $b analysis and mitigation techniques / $c by Behnam Ghavami, Mohsen Raji.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2021.
300 $a xiii, 114 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
520 $a This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Provides an accessible, comprehensive introduction to soft errors; Describes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuits; Includes state-of-the art soft error aware CAD algorithms; Describes practical soft error aware synthesis techniques for commercial large-scale VLSI designs.
650 0 $a Integrated circuits $x Very large scale integration. $3 180020
650 1 4 $a Circuits and Systems. $3 274416
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 274412
650 2 4 $a Cyber-physical systems, IoT. $3 836359
700 1 $a Raji, Mohsen. $3 887734
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-030-51610-9
950 $a Engineering (SpringerNature-11647)