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Scanning probe microscopythe lab on ...

Bennewitz, Roland.

Scanning probe microscopythe lab on a tip /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Scanning probe microscopyby Ernst Meyer, Roland Bennewitz, Hans J. Hug.
Reminder of title:	the lab on a tip /
Author:	Meyer, Ernst.
other author:	Bennewitz, Roland.
Published:	Cham :Springer International Publishing :2021.
Description:	xiv, 322 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Scanning probe microscopy.
Online resource:	https://doi.org/10.1007/978-3-030-37089-3
ISBN:	9783030370893$q(electronic bk.)

Scanning probe microscopythe lab on a tip /
Meyer, Ernst.

Scanning probe microscopythe lab on a tip /[electronic resource] :by Ernst Meyer, Roland Bennewitz, Hans J. Hug. - Second edition. - Cham :Springer International Publishing :2021. - xiv, 322 p. :ill., digital ;24 cm. - Graduate texts in physics,1868-4513. - Graduate texts in physics..

Introduction to Scanning Probe Microscopy -- Overview -- Basic Concepts -- Introduction to Scanning Tunneling Microscopy -- Tunneling: A Quantum-Mechanical Effect -- Instrumental Aspects -- Resolution Limits -- Observation of Confined Electrons -- Spin-Polarized Tunneling -- Observation of the Kondo Effect and Quantum Mirage -- Force Microscopy -- Concept and Instrumental Aspects -- Relevant Forces -- Operation Modes in Force Microscopy -- Contact Force Microscopy -- Dynamic Force Microscopy -- Tapping Mode Force Microscopy -- Further Modes of Force Microscopy -- Force Resolution and Thermal Noise -- High-speed AFM -- Multifrequency AFM -- MFM and Related Techniques -- MFM Operation Modes -- Contrast Formation -- Magnetic Resonance Force Microscopy -- Other Members of the SPM Family -- Artifacts in SPM -- Future Aspects of SPM.

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.

ISBN: 9783030370893$q(electronic bk.)

Standard No.: 10.1007/978-3-030-37089-3doiSubjects--Topical Terms:

189049
Scanning probe microscopy.

LC Class. No.: QH212.S33 / M49 2021

Dewey Class. No.: 502.825

Scanning probe microscopythe lab on a tip /
LDR:03424nmm a2200361 a 4500 001 598909
003 DE-He213
005 20210531165020.0
006 m d
007 cr nn 008maaau
008 211025s2021 sz s 0 eng d
020 $a 9783030370893$q(electronic bk.)
020 $a 9783030370886$q(paper)
024 7 $a 10.1007/978-3-030-37089-3 $2 doi
035 $a 978-3-030-37089-3
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.S33 $b M49 2021
072 7 $a PNFS $2 bicssc
072 7 $a SCI078000 $2 bisacsh
072 7 $a PNFS $2 thema
072 7 $a PDN $2 thema
082 0 4 $a 502.825 $2 23
090 $a QH212.S33 $b M612 2021
100 1 $a Meyer, Ernst. $3 711869
245 1 0 $a Scanning probe microscopy $h [electronic resource] : $b the lab on a tip / $c by Ernst Meyer, Roland Bennewitz, Hans J. Hug.
250 $a Second edition.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2021.
300 $a xiv, 322 p. : $b ill., digital ; $c 24 cm.
490 1 $a Graduate texts in physics, $x 1868-4513
505 0 $a Introduction to Scanning Probe Microscopy -- Overview -- Basic Concepts -- Introduction to Scanning Tunneling Microscopy -- Tunneling: A Quantum-Mechanical Effect -- Instrumental Aspects -- Resolution Limits -- Observation of Confined Electrons -- Spin-Polarized Tunneling -- Observation of the Kondo Effect and Quantum Mirage -- Force Microscopy -- Concept and Instrumental Aspects -- Relevant Forces -- Operation Modes in Force Microscopy -- Contact Force Microscopy -- Dynamic Force Microscopy -- Tapping Mode Force Microscopy -- Further Modes of Force Microscopy -- Force Resolution and Thermal Noise -- High-speed AFM -- Multifrequency AFM -- MFM and Related Techniques -- MFM Operation Modes -- Contrast Formation -- Magnetic Resonance Force Microscopy -- Other Members of the SPM Family -- Artifacts in SPM -- Future Aspects of SPM.
520 $a Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.
650 0 $a Scanning probe microscopy. $3 189049
650 1 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 274441
650 2 4 $a Spectroscopy/Spectrometry. $3 375491
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Measurement Science and Instrumentation. $3 376366
650 2 4 $a Condensed Matter Physics. $3 376278
700 1 $a Bennewitz, Roland. $3 892854
700 1 $a Hug, Hans J. $3 892855
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
830 0 $a Graduate texts in physics. $3 513710
856 4 0 $u https://doi.org/10.1007/978-3-030-37089-3
950 $a Physics and Astronomy (SpringerNature-11651)