| Record Type: |
Electronic resources
: Monograph/item
|
| Title/Author: |
Control charts and machine learning for anomaly detection in manufacturingedited by Kim Phuc Tran. |
| other author: |
Tran, Kim Phuc. |
| Published: |
Cham :Springer International Publishing :2022. |
| Description: |
vi, 269 p. :ill. (some col.), digital ;24 cm. |
| Contained By: |
Springer Nature eBook |
| Subject: |
Machine learning. |
| Online resource: |
https://doi.org/10.1007/978-3-030-83819-5 |
| ISBN: |
9783030838195$q(electronic bk.) |