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Tantalum and niobium-based capacitorsscience, technology, and applications /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Tantalum and niobium-based capacitorsby Yuri Freeman.
其他題名:	science, technology, and applications /
作者:	Freeman, Yuri.
出版者:	Cham :Springer International Publishing :2022.
面頁冊數:	xxi, 149 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Capacitors.
電子資源:	https://doi.org/10.1007/978-3-030-89514-3
ISBN:	9783030895143$q(electronic bk.)

Tantalum and niobium-based capacitorsscience, technology, and applications /
Freeman, Yuri.

Tantalum and niobium-based capacitorsscience, technology, and applications /[electronic resource] :by Yuri Freeman. - Second edition. - Cham :Springer International Publishing :2022. - xxi, 149 p. :ill., digital ;24 cm.

Introduction -- 1: Major Degradation Mechanisms -- 2: Basic Technology -- 3: Applications -- 4: Conclusion.

This book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb) Technology-related coverage includes chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated. The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics.

ISBN: 9783030895143$q(electronic bk.)

Standard No.: 10.1007/978-3-030-89514-3doiSubjects--Topical Terms:

238364
Capacitors.

LC Class. No.: TK7872.C65 / F74 2022

Dewey Class. No.: 621.315

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505 0 $a Introduction -- 1: Major Degradation Mechanisms -- 2: Basic Technology -- 3: Applications -- 4: Conclusion.
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