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Advanced laser diode reliability

Record Type:	Electronic resources : Monograph/item
Title/Author:	Advanced laser diode reliabilityMassimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura.
Author:	Vanzi, Massimo.
other author:	Béchou, Laurent.
Published:	London, UK :ISTE Press ;2020.
Description:	1 online resource.
Subject:	Diodes, SemiconductorReliability.
Online resource:	https://www.sciencedirect.com/science/book/9781785481543
ISBN:	9780081010891 (electronic bk.)

Advanced laser diode reliability
Vanzi, Massimo.

Advanced laser diode reliability[electronic resource] /Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura. - London, UK :ISTE Press ;2020. - 1 online resource.

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.

ISBN: 9780081010891 (electronic bk.)

Nat. Bib. No.: GBB7B5448bnbSubjects--Topical Terms:

928053
Diodes, Semiconductor
--Reliability.Index Terms--Genre/Form:

214472
Electronic books.

LC Class. No.: TK7871.86

Dewey Class. No.: 621.381522

Advanced laser diode reliability
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008 230109s2020 enk o 000 0 eng
015 $a GBB7B5448 $2 bnb
020 $a 9780081010891 (electronic bk.)
020 $a 9781785481543 (hbk.)
035 $a 022616293
040 $a StDuBDS $b eng $c StDuBDS $d Uk
041 0 $a eng
050 4 $a TK7871.86
082 0 4 $a 621.381522 $2 23
100 1 $a Vanzi, Massimo. $3 928050
245 1 0 $a Advanced laser diode reliability $h [electronic resource] / $c Massimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura.
260 $a London, UK : $b ISTE Press ; $a Oxford, UK - Elsevier, $c 2020.
300 $a 1 online resource.
505 0 $a 1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.
650 0 $a Diodes, Semiconductor $x Reliability. $3 928053
655 4 $a Electronic books. $2 local. $3 214472
700 1 $a Béchou, Laurent. $3 928051
700 1 $a Fukuda, Mitsuo. $3 211213
700 1 $a Mura, Giovanna. $3 928052
856 4 0 $u https://www.sciencedirect.com/science/book/9781785481543

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EB TK7871.86 2020

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https://www.sciencedirect.com/science/book/9781785481543

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