國立高雄大學圖資館 |

Language: English

Back

Theory and practice of thermal transient testing of electronic components

Record Type:	Electronic resources : Monograph/item
Title/Author:	Theory and practice of thermal transient testing of electronic componentsedited by Marta Rencz, Gábor Farkas, András Poppe.
other author:	Rencz, M.
Published:	Cham :Springer International Publishing :2022.
Description:	ix, 385 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Electronic apparatus and appliancesTesting.
Online resource:	https://doi.org/10.1007/978-3-030-86174-2
ISBN:	9783030861742$q(electronic bk.)

Theory and practice of thermal transient testing of electronic components
Theory and practice of thermal transient testing of electronic components[electronic resource] /edited by Marta Rencz, Gábor Farkas, András Poppe. - Cham :Springer International Publishing :2022. - ix, 385 p. :ill., digital ;24 cm.

Introduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements.

This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices.

ISBN: 9783030861742$q(electronic bk.)

Standard No.: 10.1007/978-3-030-86174-2doiSubjects--Topical Terms:

263596
Electronic apparatus and appliances
--Testing.

LC Class. No.: TK7870 / .T44 2022

Dewey Class. No.: 621.381

Theory and practice of thermal transient testing of electronic components
LDR:02818nmm a2200325 a 4500 001 634600
003 DE-He213
005 20230124120045.0
006 m d
007 cr nn 008maaau
008 230529s2022 sz s 0 eng d
020 $a 9783030861742$q(electronic bk.)
020 $a 9783030861735$q(paper)
024 7 $a 10.1007/978-3-030-86174-2 $2 doi
035 $a 978-3-030-86174-2
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7870 $b .T44 2022
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TJF $2 thema
082 0 4 $a 621.381 $2 23
090 $a TK7870 $b .T396 2022
245 0 0 $a Theory and practice of thermal transient testing of electronic components $h [electronic resource] / $c edited by Marta Rencz, Gábor Farkas, András Poppe.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2022.
300 $a ix, 385 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements.
520 $a This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices.
650 0 $a Electronic apparatus and appliances $x Testing. $3 263596
650 1 4 $a Electronics and Microelectronics, Instrumentation. $3 274412
650 2 4 $a Electrical Power Engineering. $3 919410
650 2 4 $a Electronic Circuits and Systems. $3 913394
650 2 4 $a Materials Engineering. $3 682881
700 1 $a Rencz, M. $3 941055
700 1 $a Farkas, Gabor. $3 941056
700 1 $a Poppe, Andras. $3 675250
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-030-86174-2
950 $a Physics and Astronomy (SpringerNature-11651)