國立高雄大學圖資館 |

Language: English

Back

Machine learning support for fault diagnosis of System-on-Chip

Record Type:	Electronic resources : Monograph/item
Title/Author:	Machine learning support for fault diagnosis of System-on-Chipedited by Patrick Girard, Shawn Blanton, Li-C. Wang.
other author:	Girard, Patrick.
Published:	Cham :Springer International Publishing :2023.
Description:	xi, 316 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Electric fault location.
Online resource:	https://doi.org/10.1007/978-3-031-19639-3
ISBN:	9783031196393$q(electronic bk.)

Machine learning support for fault diagnosis of System-on-Chip
Machine learning support for fault diagnosis of System-on-Chip[electronic resource] /edited by Patrick Girard, Shawn Blanton, Li-C. Wang. - Cham :Springer International Publishing :2023. - xi, 316 p. :ill., digital ;24 cm.

Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion.

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques. The benefits of the book for the reader are: Identifies the key challenges in fault diagnosis of system-on-chip and presents the solutions and corresponding results that have emerged from leading-edge research; Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing; Includes necessary background information on testing and diagnosis and a compendium of solutions existing in this field; Demonstrates techniques based on industrial data and feedback from actual PFA analysis; Discusses practical problems, including test sequence quality, diagnosis resolution, accuracy, time cost, etc.

ISBN: 9783031196393$q(electronic bk.)

Standard No.: 10.1007/978-3-031-19639-3doiSubjects--Topical Terms:

455901
Electric fault location.

LC Class. No.: TK3226 / .M33 2023

Dewey Class. No.: 621.3815

Machine learning support for fault diagnosis of System-on-Chip
LDR:03206nmm a2200325 a 4500 001 642971
003 DE-He213
005 20230313130756.0
006 m d
007 cr nn 008maaau
008 231123s2023 sz s 0 eng d
020 $a 9783031196393$q(electronic bk.)
020 $a 9783031196386$q(paper)
024 7 $a 10.1007/978-3-031-19639-3 $2 doi
035 $a 978-3-031-19639-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TK3226 $b .M33 2023
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK3226 $b .M149 2023
245 0 0 $a Machine learning support for fault diagnosis of System-on-Chip $h [electronic resource] / $c edited by Patrick Girard, Shawn Blanton, Li-C. Wang.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2023.
300 $a xi, 316 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion.
520 $a This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques. The benefits of the book for the reader are: Identifies the key challenges in fault diagnosis of system-on-chip and presents the solutions and corresponding results that have emerged from leading-edge research; Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing; Includes necessary background information on testing and diagnosis and a compendium of solutions existing in this field; Demonstrates techniques based on industrial data and feedback from actual PFA analysis; Discusses practical problems, including test sequence quality, diagnosis resolution, accuracy, time cost, etc.
650 0 $a Electric fault location. $3 455901
650 0 $a Systems on a chip. $3 224012
650 0 $a Machine learning. $3 188639
650 1 4 $a Electronic Circuits and Systems. $3 913394
650 2 4 $a Electronics Design and Verification. $3 919565
650 2 4 $a Processor Architectures. $3 274498
700 1 $a Girard, Patrick. $3 485408
700 1 $a Blanton, Shawn. $3 950468
700 1 $a Wang, Li-C. $3 950469
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-19639-3
950 $a Engineering (SpringerNature-11647)