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Fundamentals of electromigration-aware integrated circuit design

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Fundamentals of electromigration-aware integrated circuit designby Jens Lienig, Susann Rothe, Matthias Thiele.
作者:	Lienig, Jens.
其他作者:	Rothe, Susann.
出版者:	Cham :Springer Nature Switzerland :2025.
面頁冊數:	xv, 167 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Integrated circuitsDesign and construction.
電子資源:	https://doi.org/10.1007/978-3-031-80023-8
ISBN:	9783031800238$q(electronic bk.)

Fundamentals of electromigration-aware integrated circuit design
Lienig, Jens.

Fundamentals of electromigration-aware integrated circuit design[electronic resource] /by Jens Lienig, Susann Rothe, Matthias Thiele. - Second edition. - Cham :Springer Nature Switzerland :2025. - xv, 167 p. :ill., digital ;24 cm.

Introduction -- Fundamentals of Electromigration -- Integrated Circuit Design and Electromigration -- Mitigating Electromigration in Physical Design -- Summary and Outlook.

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability. Contents Introduction - Fundamentals of Electromigration - Integrated Circuit Design and Electromigration - Mitigating Electromigration in Physical Design - Summary and Outlook "This improved, second edition of the book provides the fundamental science necessary for a sound grounding from which to make practical use of the complete and indispensable application-oriented information regarding the electromigration-aware design of electronic systems. It is a foundational reference for today's design professionals, as well as for the next generation of engineering students." Prof. Worthy Martin, Emeritus Associate Professor of Computer Science, University of Virginia "This is a long-awaited book bridging the design and reliability methodologies imperative for generating robust and high-performing semiconductor devices. A deep insight into physics of the electromigration induced degradation of on-chip interconnect components as well as explaining a design specific failure development are beneficial for both the chip-design and materials engineering communities." Dr. Valeriy Sukharev, Chief Scientist, Siemens EDA "This book summarizes our current understanding of electromigration and how its effects can be moderated in practice. Particularly important and valuable are techniques that can address electromigration in modern automated design flows." Dr. Igor Markov, Distinguished Architect, Synopsys, Inc.

ISBN: 9783031800238$q(electronic bk.)

Standard No.: 10.1007/978-3-031-80023-8doiSubjects--Topical Terms:

184690
Integrated circuits
--Design and construction.

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

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