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Quality infrastructure of graphene and related two-dimensional materialsmetrology /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Quality infrastructure of graphene and related two-dimensional materialseditor, Lingling Ren ; translators, Lingling Ren, Xin Li.
其他題名:	metrology /
其他作者:	Ren, Lingling.
出版者:	Singapore :World Scientific,c2025.
面頁冊數:	1 online resource (xxxiv, 243 p.) :ill. (some col.)
附註:	Translation of: 石墨烯材料质量技术基础 : 计量
標題:	GraphineAnalysis.
電子資源:	https://www.worldscientific.com/worldscibooks/10.1142/13916#t=toc
ISBN:	9789811295713$q(ebook for institutions)

Quality infrastructure of graphene and related two-dimensional materialsmetrology /
石墨烯材料質量技術基礎.Eglish

Quality infrastructure of graphene and related two-dimensional materialsmetrology /[electronic resource] :editor, Lingling Ren ; translators, Lingling Ren, Xin Li. - 1st ed. - Singapore :World Scientific,c2025. - 1 online resource (xxxiv, 243 p.) :ill. (some col.) - Advanced materials at the strategic frontier. Graphine publishing project. - Advanced materials at the strategic frontier.Graphine publishing project..

Translation of: 石墨烯材料质量技术基础 : 计量

Includes bibliographical references and index.

"Graphene-related two-dimensional materials have attracted the attention of people in various fields the moment they appeared. The industrial application of graphene-related two-dimensional materials needs the support of a high-quality infrastructure system, including metrology, standardization, inspection and conformity assessment. In this book, the authors elaborate some key metrological results on graphene-related two-dimensional materials. For easier understanding, this book first describes the basic concepts of metrology, material metrology, and related metrological terms, such as traceability, uncertainty, error, and certified reference material (CRM). Metrological technology frameworks for quality evaluation of advanced materials including graphene-related materials are then proposed. Furthermore, the metrological techniques on structural characterization of graphene-related two-dimensional materials, such as Raman spectroscopy, X-ray diffraction, atomic force microscopy and electron microscopy, are introduced including the study of CRM, valid measurement method, interlaboratory comparison (ILC). Lastly, this book also describes the standardizations of the measurement methods of graphene-related two-dimensional materials, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry and Fourier transform infrared spectrometer based on ILC. As a result, accurate and consistent measurement results can be achieved through the established measurement standards, reference materials, and standard measurement methods. The worldwide equivalent results may ensure the quality of graphene products, promoting the standardization, mass production and sustainable and healthy developments of the graphene industry"--

ISBN: 9789811295713$q(ebook for institutions)Subjects--Topical Terms:

995920
Graphine
--Analysis.

LC Class. No.: TA455.G65 / T4313 2025

Dewey Class. No.: 662/.92

Quality infrastructure of graphene and related two-dimensional materialsmetrology /
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245 1 0 $a Quality infrastructure of graphene and related two-dimensional materials $h [electronic resource] : $b metrology / $c editor, Lingling Ren ; translators, Lingling Ren, Xin Li.
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300 $a 1 online resource (xxxiv, 243 p.) : $b ill. (some col.)
490 1 $a Advanced materials at the strategic frontier. Graphine publishing project
500 $a Translation of: 石墨烯材料质量技术基础 : 计量
504 $a Includes bibliographical references and index.
520 $a "Graphene-related two-dimensional materials have attracted the attention of people in various fields the moment they appeared. The industrial application of graphene-related two-dimensional materials needs the support of a high-quality infrastructure system, including metrology, standardization, inspection and conformity assessment. In this book, the authors elaborate some key metrological results on graphene-related two-dimensional materials. For easier understanding, this book first describes the basic concepts of metrology, material metrology, and related metrological terms, such as traceability, uncertainty, error, and certified reference material (CRM). Metrological technology frameworks for quality evaluation of advanced materials including graphene-related materials are then proposed. Furthermore, the metrological techniques on structural characterization of graphene-related two-dimensional materials, such as Raman spectroscopy, X-ray diffraction, atomic force microscopy and electron microscopy, are introduced including the study of CRM, valid measurement method, interlaboratory comparison (ILC). Lastly, this book also describes the standardizations of the measurement methods of graphene-related two-dimensional materials, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry and Fourier transform infrared spectrometer based on ILC. As a result, accurate and consistent measurement results can be achieved through the established measurement standards, reference materials, and standard measurement methods. The worldwide equivalent results may ensure the quality of graphene products, promoting the standardization, mass production and sustainable and healthy developments of the graphene industry"-- $c Provided by publisher.
588 $a Description based on print version record.
650 0 $a Graphine $x Analysis. $3 995920
650 0 $a Physical measurements. $3 197823
700 1 $a Ren, Lingling. $3 995918
700 1 $a Li, Xin. $3 264175
830 0 $a Advanced materials at the strategic frontier. $p Graphine publishing project. $3 995919
856 4 0 $u https://www.worldscientific.com/worldscibooks/10.1142/13916#t=toc