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Light and x-ray opticsrefraction, reflection, diffraction, optical devices, microscopic imaging /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Light and x-ray opticsEmil Zolotoryabko.
Reminder of title:	refraction, reflection, diffraction, optical devices, microscopic imaging /
Author:	Zolotoyabko, Emil.
Published:	Berlin ;De Gruyter,c2023.
Description:	1 online resource (xii, 286 p.) :ill. (chiefly col.), col. port.
Notes:	Includes index.
Subject:	X-ray optics.
Online resource:	https://www.degruyterbrill.com/isbn/9783111140100
ISBN:	9783111140100$q(electronic bk. ;$qPDF)

Light and x-ray opticsrefraction, reflection, diffraction, optical devices, microscopic imaging /
Zolotoyabko, Emil.

Light and x-ray opticsrefraction, reflection, diffraction, optical devices, microscopic imaging /[electronic resource] :Emil Zolotoryabko. - 1st ed. - Berlin ;De Gruyter,c2023. - 1 online resource (xii, 286 p.) :ill. (chiefly col.), col. port. - De Gruyter STEM. - De Gruyter STEM..

Includes index.

Introduction -- Foundations of geometrical optics -- Fermat's principle: light reflection and refraction -- Fermat's principle: focusing of visible light and X-rays -- Refractive index in anisotropic crystals -- Polarization, birefringence, and related phenomena -- Strong frequency effects in light optics -- Interference phenomena -- Light and X-ray interferometers -- Phase-contrast microscopy -- Fraunhofer diffraction -- Beyond diffraction limit -- Fresnel diffraction -- Optics of dynamical diffraction -- Dynamical diffraction of quantum beams: basic principles -- Specific features of dynamical X-ray diffraction -- Optical phenomena in photonic structures -- List of scientists.

Contemporary optics is the foundation of many of today's technologies including various focusing and defocusing devices, microscopies and imaging techniques. Light and X-ray Optis for Materials Scientists and Engineers offers a guide to basic concepts and provides an accessible framework for understanding this highly application-relevant branch of science for materials scientists, physicists, chemists, biologists, and engineers trained in different disciplines. The text links the fundamentals of optics to modern applications, especially for promotion of nanotechnology and life science, such as conventional, near-field, confocal, phase-contrast microscopies and imaging schemes based on interference and diffraction phenomena. Written by a noted expert and experienced instructor, the book contains numerous worked examples throughout to help the reader gain a thorough understanding of the concepts and information presented. The text covers a wide range of relevant topics, including reflection, refraction, and focusing phenomena, wave polarization and birefringence in crystals, optics in negative materials, metamaterials, and photonic structures, holography, light and X-ray interferometry, extensive description of diffraction optics, including dynamical X-ray diffraction, and more.

Mode of access: Internet via World Wide Web.

In English.

ISBN: 9783111140100$q(electronic bk. ;$qPDF)

Standard No.: 10.1515/9783111140100doiSubjects--Topical Terms:

229824
X-ray optics.

LC Class. No.: TA1775 / Z75 2023

Dewey Class. No.: 621.36

Light and x-ray opticsrefraction, reflection, diffraction, optical devices, microscopic imaging /
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245 1 0 $a Light and x-ray optics $h [electronic resource] : $b refraction, reflection, diffraction, optical devices, microscopic imaging / $c Emil Zolotoryabko.
250 $a 1st ed.
260 $a Berlin ; $a Boston : $b De Gruyter, $c c2023.
300 $a 1 online resource (xii, 286 p.) : $b ill. (chiefly col.), col. port.
490 1 $a De Gruyter STEM
500 $a Includes index.
505 0 $a Introduction -- Foundations of geometrical optics -- Fermat's principle: light reflection and refraction -- Fermat's principle: focusing of visible light and X-rays -- Refractive index in anisotropic crystals -- Polarization, birefringence, and related phenomena -- Strong frequency effects in light optics -- Interference phenomena -- Light and X-ray interferometers -- Phase-contrast microscopy -- Fraunhofer diffraction -- Beyond diffraction limit -- Fresnel diffraction -- Optics of dynamical diffraction -- Dynamical diffraction of quantum beams: basic principles -- Specific features of dynamical X-ray diffraction -- Optical phenomena in photonic structures -- List of scientists.
520 $a Contemporary optics is the foundation of many of today's technologies including various focusing and defocusing devices, microscopies and imaging techniques. Light and X-ray Optis for Materials Scientists and Engineers offers a guide to basic concepts and provides an accessible framework for understanding this highly application-relevant branch of science for materials scientists, physicists, chemists, biologists, and engineers trained in different disciplines. The text links the fundamentals of optics to modern applications, especially for promotion of nanotechnology and life science, such as conventional, near-field, confocal, phase-contrast microscopies and imaging schemes based on interference and diffraction phenomena. Written by a noted expert and experienced instructor, the book contains numerous worked examples throughout to help the reader gain a thorough understanding of the concepts and information presented. The text covers a wide range of relevant topics, including reflection, refraction, and focusing phenomena, wave polarization and birefringence in crystals, optics in negative materials, metamaterials, and photonic structures, holography, light and X-ray interferometry, extensive description of diffraction optics, including dynamical X-ray diffraction, and more.
530 $a Issued also in print.
538 $a Mode of access: Internet via World Wide Web.
546 $a In English.
588 $a Description based on online resource; title from PDF title page (publisher's Web site, viewed September 18 2025)
650 0 $a X-ray optics. $3 229824
830 0 $a De Gruyter STEM. $3 930882
856 4 0 $u https://www.degruyterbrill.com/isbn/9783111140100