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Reliability of CMOS analog ICs

Record Type:	Electronic resources : Monograph/item
Title/Author:	Reliability of CMOS analog ICsby Hakan Kuntman ... [et al.].
other author:	Kuntman, Hakan.
Published:	Cham :Springer Nature Switzerland :2025.
Description:	xii, 94 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Analog CMOS integrated circuits.
Online resource:	https://doi.org/10.1007/978-3-031-85455-2
ISBN:	9783031854552$q(electronic bk.)

Reliability of CMOS analog ICs
Reliability of CMOS analog ICs[electronic resource] /by Hakan Kuntman ... [et al.]. - Cham :Springer Nature Switzerland :2025. - xii, 94 p. :ill. (some col.), digital ;24 cm. - Analog circuits and signal processing,2197-1854. - Analog circuits and signal processing..

Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends.

ISBN: 9783031854552$q(electronic bk.)

Standard No.: 10.1007/978-3-031-85455-2doiSubjects--Topical Terms:

710816
Analog CMOS integrated circuits.

LC Class. No.: TK7871.99.M44

Dewey Class. No.: 621.395

Reliability of CMOS analog ICs
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505 0 $a Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.
520 $a This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends.
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