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VLSI test principles and architectures :design for testability /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
VLSI test principles and architectures :edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
其他題名:
design for testability /
其他作者:
Wen, Xiaoqing.
出版者:
Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006.
面頁冊數:
xxx, 777 p. :ill. ;24 cm.
叢書名:
The Morgan Kaufmann series in systems on silicon
標題:
Integrated circuitsVery large scale integration
ISBN:
9780123705976
VLSI test principles and architectures :design for testability /
VLSI test principles and architectures :
design for testability /edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006. - xxx, 777 p. :ill. ;24 cm. - The Morgan Kaufmann series in systems on silicon.
Includes bibliographical references and index.
ISBN: 9780123705976
LCCN: 2006006869Subjects--Topical Terms:
182401
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V871 2006
Dewey Class. No.: 621.39/5
VLSI test principles and architectures :design for testability /
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