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Interconnect reliability in advanced memory device packaging

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Interconnect reliability in advanced memory device packagingby Chong Leong, Gan, Chen-Yu, Huang.
作者:	Gan, Chong Leong.
其他作者:	Huang, Chen-Yu.
出版者:	Cham :Springer International Publishing :2023.
面頁冊數:	xviii, 210 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Computer storage devicesPackaging.
電子資源:	https://doi.org/10.1007/978-3-031-26708-6
ISBN:	9783031267086$q(electronic bk.)

Interconnect reliability in advanced memory device packaging
Gan, Chong Leong.

Interconnect reliability in advanced memory device packaging[electronic resource] /by Chong Leong, Gan, Chen-Yu, Huang. - Cham :Springer International Publishing :2023. - xviii, 210 p. :ill., digital ;24 cm. - Springer series in reliability engineering,2196-999X. - Springer series in reliability engineering..

Chapter 1: Advanced Memory and Device Packaging -- Chapter 2: Wearout Reliability-based Characterization in Memory Packaging -- Chapter 3: Recycling of Noble Metals Used in Memory Packaging -- Chapter 4: Advanced Flip Chip Packaging -- Chapter 5: Second Level Interconnect Reliability of Low Temperature Solder Materials Used in Memory Modules and Solid-State Drives (SSD) -- Chapter 6: Specific Packaging Reliability Testing -- Chapter 7: Reliability Simulation and Modeling in Memory Packaging -- Chapter 8: Interconnects Reliability for Future Cryogenic Memory Applications.

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing. In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects. This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.

ISBN: 9783031267086$q(electronic bk.)

Standard No.: 10.1007/978-3-031-26708-6doiSubjects--Topical Terms:

950591
Computer storage devices
--Packaging.

LC Class. No.: TK7895.M4

Dewey Class. No.: 621.397

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520 $a This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing. In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects. This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.
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