Semiconductor storage devices - Testing.

High performance memory testingdesign principles, fault modeling, and self-test / by: (書目-電子資源)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (書目-電子資源)

Multi-run memory tests for pattern sensitive faults by: (書目-電子資源)

Computer storage devices

Mixed signal circuits

Electronics and Microelectronics, Instrumentation.

Digital integrated circuits

Processor Architectures.

Random access memory

Circuits and Systems.

Semiconductor storage devices

Engineering.

Integrated circuits