Atomic scale characterization and fi...
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  • Atomic scale characterization and first-principles studies of Si3N4 interfaces
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Atomic scale characterization and first-principles studies of Si3N4 interfacesby Weronika Walkosz.
    Author: Walkosz, Weronika.
    Published: New York, NY :Springer Science+Business Media, LLC,2011.
    Description: xiii, 108 p. :ill., digital ;24 cm.
    Series: Springer theses
    Contained By: Springer eBooks
    Subject: Interfaces (Physical sciences)
    Online resource: http://dx.doi.org/10.1007/978-1-4419-7817-2
    ISBN: 9781441978172 (electronic bk.)
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  • 1 records • Pages 1 •
 
000000055340 電子館藏 1圖書 電子書 EB QC173.4.I57 W35 2011 一般使用(Normal) On shelf 0  
  • 1 records • Pages 1 •
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