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Resonant x-ray scattering in correla...

Ishihara, Sumio.

Resonant x-ray scattering in correlated systems

Record Type:	Electronic resources : Monograph/item
Title/Author:	Resonant x-ray scattering in correlated systemsedited by Youichi Murakami, Sumio Ishihara.
other author:	Murakami, Youichi.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg :2017.
Description:	vii, 241 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	X-raysScattering.
Online resource:	http://dx.doi.org/10.1007/978-3-662-53227-0
ISBN:	9783662532270$q(electronic bk.)

Resonant x-ray scattering in correlated systems
Resonant x-ray scattering in correlated systems[electronic resource] /edited by Youichi Murakami, Sumio Ishihara. - Berlin, Heidelberg :Springer Berlin Heidelberg :2017. - vii, 241 p. :ill., digital ;24 cm. - Springer tracts in modern physics,v.2690081-3869 ;. - Springer tracts in modern physics ;168..

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii)

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

ISBN: 9783662532270$q(electronic bk.)

Standard No.: 10.1007/978-3-662-53227-0doiSubjects--Topical Terms:

229799
X-rays
--Scattering.

LC Class. No.: QC482.S3

Dewey Class. No.: 539.7222

Resonant x-ray scattering in correlated systems
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245 0 0 $a Resonant x-ray scattering in correlated systems $h [electronic resource] / $c edited by Youichi Murakami, Sumio Ishihara.
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300 $a vii, 241 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer tracts in modern physics, $x 0081-3869 ; $v v.269
505 0 $a Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii)
520 $a The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
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650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Nanotechnology and Microengineering. $3 348421
700 1 $a Murakami, Youichi. $3 772440
700 1 $a Ishihara, Sumio. $3 772441
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950 $a Physics and Astronomy (Springer-11651)