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The investigation of plastic behavio...
~
Cui, Yinan.
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
Record Type:
Electronic resources : Monograph/item
Title/Author:
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scaleby Yinan Cui.
Author:
Cui, Yinan.
Published:
Singapore :Springer Singapore :2017.
Description:
xiv, 131 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Dislocations in crystals.
Online resource:
http://dx.doi.org/10.1007/978-981-10-3032-1
ISBN:
9789811030321$q(electronic bk.)
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
Cui, Yinan.
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
[electronic resource] /by Yinan Cui. - Singapore :Springer Singapore :2017. - xiv, 131 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..
This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
ISBN: 9789811030321$q(electronic bk.)
Standard No.: 10.1007/978-981-10-3032-1doiSubjects--Topical Terms:
193598
Dislocations in crystals.
LC Class. No.: QD921
Dewey Class. No.: 548.842
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
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This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
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000000136247
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EB QD921 C966 2017
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http://dx.doi.org/10.1007/978-981-10-3032-1
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