國立高雄大學圖資館 |

Language: English

Back

LabVIEW based automation guide for m...

Dubey, Satya Kesh.

LabVIEW based automation guide for microwave measurements

Record Type:	Electronic resources : Monograph/item
Title/Author:	LabVIEW based automation guide for microwave measurementsby Satya Kesh Dubey ... [et al.].
other author:	Dubey, Satya Kesh.
Published:	Singapore :Springer Singapore :2018.
Description:	xiv, 45 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Microwave measurementsAutomation.
Online resource:	http://dx.doi.org/10.1007/978-981-10-6280-3
ISBN:	9789811062803$q(electronic bk.)

LabVIEW based automation guide for microwave measurements
LabVIEW based automation guide for microwave measurements[electronic resource] /by Satya Kesh Dubey ... [et al.]. - Singapore :Springer Singapore :2018. - xiv, 45 p. :ill., digital ;24 cm. - SpringerBriefs in electrical and computer engineering,2191-8112. - SpringerBriefs in electrical and computer engineering..

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC)

ISBN: 9789811062803$q(electronic bk.)

Standard No.: 10.1007/978-981-10-6280-3doiSubjects--Topical Terms:

801410
Microwave measurements
--Automation.

LC Class. No.: TK7876

Dewey Class. No.: 681.2

LabVIEW based automation guide for microwave measurements
LDR:02328nmm a2200325 a 4500 001 528797
003 DE-He213
005 20180620104139.0
006 m d
007 cr nn 008maaau
008 181030s2018 si s 0 eng d
020 $a 9789811062803$q(electronic bk.)
020 $a 9789811062797$q(paper)
024 7 $a 10.1007/978-981-10-6280-3 $2 doi
035 $a 978-981-10-6280-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7876
072 7 $a TJFN $2 bicssc
072 7 $a TEC024000 $2 bisacsh
072 7 $a TEC030000 $2 bisacsh
082 0 4 $a 681.2 $2 23
090 $a TK7876 $b .L127 2018
245 0 0 $a LabVIEW based automation guide for microwave measurements $h [electronic resource] / $c by Satya Kesh Dubey ... [et al.].
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2018.
300 $a xiv, 45 p. : $b ill., digital ; $c 24 cm.
490 1 $a SpringerBriefs in electrical and computer engineering, $x 2191-8112
520 $a The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC)
650 0 $a Microwave measurements $x Automation. $3 801410
650 1 4 $a Engineering. $3 210888
650 2 4 $a Microwaves, RF and Optical Engineering. $3 274186
650 2 4 $a Numerical and Computational Physics, Simulation. $3 758154
650 2 4 $a Communications Engineering, Networks. $3 273745
700 1 $a Dubey, Satya Kesh. $3 801409
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a SpringerBriefs in electrical and computer engineering. $3 557682
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-6280-3
950 $a Engineering (Springer-11647)