Language:
English
繁體中文
Help
圖資館首頁
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Machine learning in VLSI computer-ai...
~
Boning, Duane S.
Machine learning in VLSI computer-aided design
Record Type:
Electronic resources : Monograph/item
Title/Author:
Machine learning in VLSI computer-aided designedited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li.
other author:
Elfadel, Ibrahim (Abe) M.
Published:
Cham :Springer International Publishing :2019.
Description:
xxii, 694 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Integrated circuitsVery large scale integration
Online resource:
https://doi.org/10.1007/978-3-030-04666-8
ISBN:
9783030046668$q(electronic bk.)
Machine learning in VLSI computer-aided design
Machine learning in VLSI computer-aided design
[electronic resource] /edited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li. - Cham :Springer International Publishing :2019. - xxii, 694 p. :ill., digital ;24 cm.
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD -- Chapter2: Machine Learning for Compact Lithographic Process Models -- Chapter3: Machine Learning for Mask Synthesis -- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design -- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications -- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement -- Chapter7: Efficient Process Variation Characterization by Virtual Probe -- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement -- Chapter9: Machine Learning based Aging Analysis -- Chapter10: Extreme Statistics in Memories -- Chapter11: Fast Statistical Analysis Using Machine Learning -- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events -- Chapter13: Learning from Limited Data in VLSI CAD -- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion -- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits -- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling -- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems -- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors -- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle -- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine -- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
ISBN: 9783030046668$q(electronic bk.)
Standard No.: 10.1007/978-3-030-04666-8doiSubjects--Topical Terms:
184578
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75
Dewey Class. No.: 621.395
Machine learning in VLSI computer-aided design
LDR
:02603nmm a2200313 a 4500
001
554578
003
DE-He213
005
20190315165652.0
006
m d
007
cr nn 008maaau
008
191118s2019 gw s 0 eng d
020
$a
9783030046668$q(electronic bk.)
020
$a
9783030046651$q(paper)
024
7
$a
10.1007/978-3-030-04666-8
$2
doi
035
$a
978-3-030-04666-8
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7874.75
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
072
7
$a
TJFC
$2
thema
082
0 4
$a
621.395
$2
23
090
$a
TK7874.75
$b
.M149 2019
245
0 0
$a
Machine learning in VLSI computer-aided design
$h
[electronic resource] /
$c
edited by Ibrahim (Abe) M. Elfadel, Duane S. Boning, Xin Li.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2019.
300
$a
xxii, 694 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD -- Chapter2: Machine Learning for Compact Lithographic Process Models -- Chapter3: Machine Learning for Mask Synthesis -- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design -- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications -- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement -- Chapter7: Efficient Process Variation Characterization by Virtual Probe -- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement -- Chapter9: Machine Learning based Aging Analysis -- Chapter10: Extreme Statistics in Memories -- Chapter11: Fast Statistical Analysis Using Machine Learning -- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events -- Chapter13: Learning from Limited Data in VLSI CAD -- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion -- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits -- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling -- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems -- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors -- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle -- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine -- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
650
0
$a
Integrated circuits
$x
Very large scale integration
$x
Computer-aided design.
$3
184578
650
0
$a
Machine learning.
$3
188639
650
1 4
$a
Circuits and Systems.
$3
274416
650
2 4
$a
Processor Architectures.
$3
274498
650
2 4
$a
Logic Design.
$3
276275
700
1
$a
Elfadel, Ibrahim (Abe) M.
$3
830738
700
1
$a
Boning, Duane S.
$3
383008
700
1
$a
Li, Xin.
$3
264175
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
856
4 0
$u
https://doi.org/10.1007/978-3-030-04666-8
950
$a
Engineering (Springer-11647)
based on 0 review(s)
ALL
電子館藏
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
000000167440
電子館藏
1圖書
電子書
EB TK7874.75 .M149 2019 2019
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Multimedia file
https://doi.org/10.1007/978-3-030-04666-8
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login