國立高雄大學圖資館 |

Language: English

Back

Lifetime reliability-aware design of integrated circuits

Record Type:	Electronic resources : Monograph/item
Title/Author:	Lifetime reliability-aware design of integrated circuitsby Mohsen Raji, Behnam Ghavami.
Author:	Raji, Mohsen.
other author:	Ghavami, Behnam.
Published:	Cham :Springer International Publishing :2023.
Description:	xiii, 107 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Integrated circuitsDesign.
Online resource:	https://doi.org/10.1007/978-3-031-15345-7
ISBN:	9783031153457$q(electronic bk.)

Lifetime reliability-aware design of integrated circuits
Raji, Mohsen.

Lifetime reliability-aware design of integrated circuits[electronic resource] /by Mohsen Raji, Behnam Ghavami. - Cham :Springer International Publishing :2023. - xiii, 107 p. :ill., digital ;24 cm.

1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the art aging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element.

ISBN: 9783031153457$q(electronic bk.)

Standard No.: 10.1007/978-3-031-15345-7doiSubjects--Topical Terms:

218965
Integrated circuits
--Design.

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

Lifetime reliability-aware design of integrated circuits
LDR:02599nmm a2200325 a 4500 001 645178
003 DE-He213
005 20221116144801.0
006 m d
007 cr nn 008maaau
008 231208s2023 sz s 0 eng d
020 $a 9783031153457$q(electronic bk.)
020 $a 9783031153440$q(paper)
024 7 $a 10.1007/978-3-031-15345-7 $2 doi
035 $a 978-3-031-15345-7
040 $a GP $c GP $e rda
041 0 $a eng
050 4 $a TK7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK7874 $b .R161 2023
100 1 $a Raji, Mohsen. $3 887734
245 1 0 $a Lifetime reliability-aware design of integrated circuits $h [electronic resource] / $c by Mohsen Raji, Behnam Ghavami.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2023.
300 $a xiii, 107 p. : $b ill., digital ; $c 24 cm.
505 0 $a 1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.
520 $a This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the art aging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element.
650 0 $a Integrated circuits $x Design. $3 218965
650 0 $a Integrated circuits $x Reliability. $3 184558
650 1 4 $a Electronic Circuits and Systems. $3 913394
650 2 4 $a Embedded Systems. $3 919564
650 2 4 $a Electronics Design and Verification. $3 919565
700 1 $a Ghavami, Behnam. $3 887733
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-15345-7
950 $a Engineering (SpringerNature-11647)