國立高雄大學圖資館 |

登入

回首頁

Surface analysis :the principal techniques /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Surface analysis :editors, John C. Vickerman, Ian S. Gilmore.
其他題名:	the principal techniques /
其他作者:	Vickerman, J. C.
出版者:	Chichester, U.K. :Wiley,2009.
面頁冊數:	xix, 666 pages :illustrations (some color) ;26 cm
標題:	Surfaces (Technology)Analysis.
電子資源:	http://catdir.loc.gov/catdir/enhancements/fy0905/2008040278-t.html
電子資源:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
電子資源:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
電子資源:	http://www.dawsonera.com/depp/reader/protected/external/AbstractView/S9780470721575
電子資源:	http://catdir.loc.gov/catdir/enhancements/fy1603/2008040278-b.html
電子資源:	http://catdir.loc.gov/catdir/enhancements/fy0902/2008040278-d.html
ISBN:	9780470017630

Surface analysis :the principal techniques /
Surface analysis :the principal techniques /editors, John C. Vickerman, Ian S. Gilmore. - 2nd ed. - Chichester, U.K. :Wiley,2009. - xix, 666 pages :illustrations (some color) ;26 cm

Includes bibliographical references and index.

1. Introduction/ John C. Vickerman --

This completely updated and revised second edition deals with the characterization and understanding of the outer layers of substrates. It covers how they react, look and function which are all of interest to surface scientists.

ISBN: 9780470017630

LCCN: 2008040278

Nat. Bib. No.: GBA8E1857bnb

Nat. Bib. Agency Control No.: 014858296UkSubjects--Topical Terms:

224546
Surfaces (Technology)
--Analysis.Index Terms--Genre/Form:

565592
Aufsatzsammlung.

LC Class. No.: TA418.7 / .S726 2009

Dewey Class. No.: 620/.44

Surface analysis :the principal techniques /
LDR:06429cam 2200685 a 4500 001 693910
003 OCoLC
005 20260901045944.0
008 260902s2009 enka b 001 0 eng
010 $a 2008040278
015 $a GBA8E1857 $2 bnb
016 7 $a 014858296 $2 Uk
019 $a 276334346 $a 288986665 $a 297338420 $a 776917317
020 $a 9780470017630
020 $a 0470017635
020 $a 9780470017647 $q (pbk.)
020 $a 0470017643 $q (pbk.)
029 1 $a AU@ $b 000043441428
029 1 $a BWK $b L4815018
029 1 $a BWK $b L6815017
029 1 $a CDX $b 5351659
029 1 $a CDX $b 5844801
029 1 $a DEBBG $b BV035350241
029 1 $a HEBIS $b 21394698X
029 1 $a NLGGC $b 317297244
029 1 $a NZ1 $b 12891276
029 1 $a UKMGB $b 014858296
035 $a (OCoLC)254529018 $z (OCoLC)276334346 $z (OCoLC)288986665 $z (OCoLC)297338420 $z (OCoLC)776917317
035 $a ocn254529018
040 $a DLC $b eng $c DLC $d BTCTA $d BWKUK $d BWK $d WAU $d YDXCP $d UKM $d CDX $d CIT $d GA0 $d HEBIS $d DEBBG $d EUM $d SNU $d BDX $d OCLCF $d S3O $d OCLCQ $d LIP $d ESU $d OCLCQ $d OCLCO $d OCLCQ $d UKMGB $d EYM $d OCLCO $d OCL $d OCLCO $d OCLCL $d OCLCQ $d OCLCL $d OCLCQ $d IG# $d OCLCA $d OCLCL $d U3W $d OCLCO $d OCLCQ
049 $a NUKM
050 0 0 $a TA418.7 $b .S726 2009
082 0 0 $a 620/.44 $2 22 $1 https://id.oclc.org/worldcat/ddc/E3bCtypct9WYmpCD4PTTmqYVmX
082 0 0 $a 530.417 $2 22 $1 https://id.oclc.org/worldcat/ddc/E3pddTThQXrXWXHrCdcdhXTkWM
084 $a UP 7500 $2 rvk
084 $a ZM 3850 $2 rvk
084 $a ZM 7605 $2 rvk
245 0 0 $a Surface analysis : $b the principal techniques / $c editors, John C. Vickerman, Ian S. Gilmore.
250 $a 2nd ed.
260 $a Chichester, U.K. : $b Wiley, $c 2009.
300 $a xix, 666 pages : $b illustrations (some color) ; $c 26 cm
336 $a text $b txt $2 rdacontent
337 $a unmediated $b n $2 rdamedia
338 $a volume $b nc $2 rdacarrier
340 $p illustration $0 http://rdaregistry.info/termList/IllusContent/1014 $2 rdaill
340 $g polychrome $0 http://rdaregistry.info/termList/RDAColourContent/1003 $2 rdacc
504 $a Includes bibliographical references and index.
505 0 0 $t 1. Introduction $r / John C. Vickerman -- $t 1.1 How do we Define the Surface? -- $t 1.2 How Many Atoms in a Surface? -- $t 1.3 Information Required -- $t 1.4 Surface Sensitivity -- $t 1.5 Radiation Effects -- Surface Damage -- $t 1.6 Complexity of the Data -- $t 2. Auger Electron Spectroscopy $r / Hans J�org Mathieu -- $t 2.1 Introduction -- $t 2.2 Principle of the Auger Process -- $t 2.3 Instrumentation -- $t 2.4 Quantitative Analysis. -- $t 2.5 Depth Profile Analysis -- $t 2.6 Summary -- $t 3. Electron Spectroscopy for Chemical Analysis $r / Buddy D. Ratner and David G. Castner -- $t 3.1 Overview -- $t 3.2 X-ray Interaction with matter, the Photoelectron Effect and Photoemission from Solids.-- $t 3.3 Binding Energy and the Chemical Shift -- $t 3.4 Inelastic Mean Free Path and Sampling Depth -- $t 3.5 Quantification -- $t 3.6 Spectral Features -- $t 3.7 Instrumentation -- $t 3.8 Spectral Quality -- $t 3.9 Depth Profiling -- $t 3.10 X-Y Mapping and Imaging -- $t 3.11 Chemical Derivatization -- $t 3.12 Valence Band -- $t 3.13 Perspectives -- $t 3.14 Conclusions -- $t 4. Molecular Surface Mass Spectrometry by SIMS $r / John C. Vickerman -- $t 4.1 Introduction -- $t 4.2 Basic Concepts -- $t 4.3 Experimental Requirements -- $t 4.4 Secondary Ion Formation -- $t 4.5 Modes of Analysis -- $t 4.6 Ionization of the Sputtered Neutrals -- $t 4.7 Ambient Methods of Desorption Mass Spectrometry. -- $t 5. Dynamic SIMS $r / David McPhail and Mark Dowsett -- $t 5.1 Fundamentals and Attributes -- $t 5.2 Areas and Methods of Application -- $t 5.3 Quantification of Data -- $t 5.4 Novel Approaches -- $t 5.5 Instrumentation -- $t 5.6 Conclusions. -- $t 6. Low-Energy Ion Scattering and Rutherford Backscattering $r / Edmund Taglauer -- $t 6.1 Introduction -- $t 6.2 Physical Basis -- $t 6.3 Rutherford Backscattering -- $t 6.4 Low-Energy Ion Scattering -- $t 7. Vibrational Spectroscopy from Surfaces $r / Martyn E. Pemble and Peter Gardner -- $t 7.1 Introduction -- $t 7.2 Infrared Spectroscopy from Surfaces -- $t 7.3 Electron Energy Loss Spectroscopy (EELS) -- $t 7.4 The Group Theory of Surface Vibrations -- $t 7.5 Laser Raman Spectroscopy from Surfaces -- $t 7.6 Inelastic Neutron Scattering (INS) -- $t 7.7 Sum-Frequency Generation Methods. References. Problems -- $t 8. Surface Structure Determination by Interference Techniques $r / Christopher A. Lucas -- $t 8.1 Introduction -- $t 8.2 Electron Diffraction Techniques -- $t 8.3 X-ray Techniques -- $t 8.4 Photoelectron Diffraction -- $t 9. Scanning Probe Microscopy $r / Graham J. Leggett -- $t 9.1 Introduction -- $t 9.2 Scanning Tunnelling Microscopy -- $t 9.3 Atomic Force Microscopy -- $t 9.4 Scanning Near-Field Optical Microscopy -- $t 9.5 Other Scanning Probe Microscopy Techniques -- $t 9.6 Lithography Using Probe Microscopy Methods -- $t 9.7 Conclusions -- $t 10. The Application of Multivariate Data Analysis Techniques in Surface Analysis $r / Joanna L.S. Lee and Ian S. Gilmore -- $t 10.1 Introduction -- $t 10.2 Basic Concepts -- $t 10.3 Factor Analysis for Identification -- $t 10.4 Regression Methods for Quantification -- $t 10.5 Methods for Classification -- $t 10.6 Summary and Conclusion.
520 8 $a This completely updated and revised second edition deals with the characterization and understanding of the outer layers of substrates. It covers how they react, look and function which are all of interest to surface scientists.
650 0 $a Surfaces (Technology) $x Analysis. $3 224546
650 0 $a Spectrum analysis. $3 188665
650 0 $a Surfaces (Physics) $3 224173
650 6 $a Surfaces (Physique) $v Periodiques. $3 452361
650 6 $a Surfaces (Technologie) $x Analyse. $3 1010712
650 7 $a Spectrum analysis $3 252492
650 7 $a Surfaces (Technology) $x Analysis $2 fast $3 1010713
650 7 $a Oberfl�achenanalyse $2 gnd $3 1010714
650 7 $a Spektralanalys. $2 sao $3 1010715
650 7 $a Ytteknik. $2 sao $3 1010716
655 4 $a Aufsatzsammlung. $3 565592
700 1 $a Vickerman, J. C. $3 242589
700 1 $a Gilmore, Ian S. $q (Ian Stuart) $1 https://id.oclc.org/worldcat/entity/E39PCjt9bYWr9Hf4R3Wggm87gX $3 1010711
856 4 1 $3 Table of contents $u http://catdir.loc.gov/catdir/enhancements/fy0905/2008040278-t.html
856 4 1 $3 Table of contents $u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
856 4 1 $3 Table of contents $u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
856 4 1 $u http://www.dawsonera.com/depp/reader/protected/external/AbstractView/S9780470721575 $z to access electronic resource
856 4 2 $3 Contributor biographical information $u http://catdir.loc.gov/catdir/enhancements/fy1603/2008040278-b.html
856 4 2 $3 Publisher description $u http://catdir.loc.gov/catdir/enhancements/fy0902/2008040278-d.html
938 $a Ingram Library Services $b INGR $n in016531343
938 $a Brodart $b BROD $n 10204989 $c $255.00
938 $a Baker and Taylor $b BTCP $n BK0008298041
938 $a Coutts Information Services $b COUT $n 5844801
938 $a YBP Library Services $b YANK $n 100510104
994 $a C0 $b TWNUK

筆 0 讀者評論

館藏

1 筆 • 頁數 1 •
1

附件

320000753113

西方語文圖書區(四樓)

1圖書

一般圖書

TA418.7 S961 2009

一般使用(Normal)

在架

1 筆 • 頁數 1 •
1

多媒體

多媒體檔案
http://catdir.loc.gov/catdir/enhancements/fy0905/2008040278-t.html
http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017154398&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
http://www.dawsonera.com/depp/reader/protected/external/AbstractView/S9780470721575
http://catdir.loc.gov/catdir/enhancements/fy1603/2008040278-b.html
http://catdir.loc.gov/catdir/enhancements/fy0902/2008040278-d.html

評論

新增評論分享你的心得

Export

取書館別