Wen, Xiaoqing.
Overview
Works: | 2 works in 1 publications in 1 languages |
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Titles
VLSI test principles and architectures :design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(Language materials, printed)
Power-aware testing and test strategies for low power devices
by:
Girard, Patrick.; Nicolici, Nicola.; SpringerLink (Online service); Wen, Xiaoqing.
(Electronic resources)
VLSI test principles and architecturesdesign for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(Electronic resources)
Subjects
Circuits int�egr�es �a tr�es grande �echelle
Integrated circuits / Very large scale integration / Testing.
VLSI.
COMPUTERS
Integrated circuits / Very large scale integration / Design.
Computer-Aided Engineering (CAD, CAE) and Design.
Low voltage integrated circuits
Circuits and Systems.
TECHNOLOGY & ENGINEERING
Engineering.
Circuitos integrados vlsi.
Testen.
Integrated circuits