Languages
Celano, Umberto.
Overview
Works: | 2 works in 2 publications in 1 languages |
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Titles
Electrical atomic force microscopy for nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(Electronic resources)
Metrology and physical mechanisms in new generation ionic devices
by:
Celano, Umberto.; SpringerLink (Online service)
(Electronic resources)
Subjects
Nanoscale Science and Technology.
Nanotechnology.
Electronics and Microelectronics, Instrumentation.
Electronic apparatus and appliances.
Nonvolatile random-access memory.
Spectroscopy and Microscopy.
Atomic force microscopy.
Nanotechnology and Microengineering.
Thin films.
Physics.
Characterization and Evaluation of Materials.
Nanoelectronics.
Optical and Electronic Materials.
Metrology.