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From contamination to defects, fault...
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Khare, Jitendra B.
From contamination to defects, faults, and yield loss :simulation and applications /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
From contamination to defects, faults, and yield loss :by Jitendra B. Khare, Wojciech Maly.
Reminder of title:
simulation and applications /
Author:
Khare, Jitendra B.
other author:
Maly, W.
Published:
Boston :Kluwer Academic Publishers,c1996.
Description:
150 p. :ill. ;24 cm.
Series:
Frontiers in electronic testing
Subject:
Integrated circuitsVery large scale integration
ISBN:
0792397142 (acid-free paper) :
From contamination to defects, faults, and yield loss :simulation and applications /
Khare, Jitendra B.
From contamination to defects, faults, and yield loss :
simulation and applications /by Jitendra B. Khare, Wojciech Maly. - Boston :Kluwer Academic Publishers,c1996. - 150 p. :ill. ;24 cm. - Frontiers in electronic testing.
Includes bibliographical references and index.
ISBN: 0792397142 (acid-free paper) :NT$3,500
LCCN: 96005441 Subjects--Topical Terms:
184609
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / K45 1996
Dewey Class. No.: 621.3815/2/0685
From contamination to defects, faults, and yield loss :simulation and applications /
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Khare, Jitendra B.
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From contamination to defects, faults, and yield loss :
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simulation and applications /
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by Jitendra B. Khare, Wojciech Maly.
260
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Boston :
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c1996.
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Kluwer Academic Publishers,
300
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150 p. :
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ill. ;
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24 cm.
440
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Frontiers in electronic testing
504
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Includes bibliographical references and index.
650
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Integrated circuits
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Very large scale integration
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Defects.
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184609
650
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Integrated circuits
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Very large scale integration
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Computer simulation.
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184610
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Integrated circuits
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Very large scale integration
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Testing.
$3
182401
650
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Computer-aided design.
$3
181931
700
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Maly, W.
$3
184607
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西方語文圖書區(四樓)
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1 records • Pages 1 •
1
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320000049124
西方語文圖書區(四樓)
1圖書
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TK7874.75 K45 1996
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1 records • Pages 1 •
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