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Testability concepts for digital ICs...
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Beenker, F. P. M.
Testability concepts for digital ICs :the macro test approach /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Testability concepts for digital ICs :by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
Reminder of title:
the macro test approach /
Author:
Beenker, F. P. M.
other author:
Bennetts, R. G.
Published:
Boston :Kluwer Academic Publishers,c1995.
Description:
ix, 212 p. :ill. ;25 cm.
Series:
Frontiers in electronic testing
Subject:
Automatic checkout equipment.
ISBN:
0792396588 (hardcover : alk. paper) :
Testability concepts for digital ICs :the macro test approach /
Beenker, F. P. M.
Testability concepts for digital ICs :
the macro test approach /by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen. - Boston :Kluwer Academic Publishers,c1995. - ix, 212 p. :ill. ;25 cm. - Frontiers in electronic testing.
Includes bibliographical references (p. 197-205).
ISBN: 0792396588 (hardcover : alk. paper) :NT$3,616
LCCN: 95040166 Subjects--Topical Terms:
185573
Automatic checkout equipment.
LC Class. No.: TK7874.65 / B414 1996
Dewey Class. No.: 621.3815/48
Testability concepts for digital ICs :the macro test approach /
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Beenker, F. P. M.
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(Frans P. M.)
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Testability concepts for digital ICs :
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the macro test approach /
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by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
260
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Boston :
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Dordrecht ;
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c1995.
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Kluwer Academic Publishers,
300
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ix, 212 p. :
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ill. ;
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25 cm.
440
0
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Frontiers in electronic testing
504
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Includes bibliographical references (p. 197-205).
650
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Automatic checkout equipment.
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185573
650
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Digital integrated circuits
$x
Testing.
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182402
700
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Bennetts, R. G.
$3
185570
700
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Thijssen, A. P.
$3
185571
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320000050825
西方語文圖書區(四樓)
1圖書
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TK7874.65 B414 1996
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1 records • Pages 1 •
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