Testability concepts for digital ICs...
Beenker, F. P. M.

 

  • Testability concepts for digital ICs :the macro test approach /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Testability concepts for digital ICs :by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
    Reminder of title: the macro test approach /
    Author: Beenker, F. P. M.
    other author: Bennetts, R. G.
    Published: Boston :Kluwer Academic Publishers,c1995.
    Description: ix, 212 p. :ill. ;25 cm.
    Series: Frontiers in electronic testing
    Subject: Automatic checkout equipment.
    ISBN: 0792396588 (hardcover : alk. paper) :
Items
  • 1 records • Pages 1 •
 
320000050825 西方語文圖書區(四樓) 1圖書 一般圖書 TK7874.65 B414 1996 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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