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Testing and testable design of high-...

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Chakraborty, Kanad.

Testing and testable design of high-density random-access memories /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Testing and testable design of high-density random-access memories /by Pinaki Mazumder and Kanad Chakraborty.
作者:	Mazumder, Pinaki.
其他作者:	Chakraborty, Kanad.
出版者:	Boston, Mass :Kluwer Academic,1996.
面頁冊數:	xxxviii, 386 p. :ill. ;25 cm.
叢書名:	Frontiers in electronic testing
標題:	Random access memoryTesting.
ISBN:	0792397827 (alk. paper) :

Testing and testable design of high-density random-access memories /
Mazumder, Pinaki.

Testing and testable design of high-density random-access memories /by Pinaki Mazumder and Kanad Chakraborty. - Boston, Mass :Kluwer Academic,1996. - xxxviii, 386 p. :ill. ;25 cm. - Frontiers in electronic testing.

Includes bibliographical references (p. [367]-381) and index.

ISBN: 0792397827 (alk. paper) :NT$4,684

LCCN: 96027507 Subjects--Topical Terms:

185576
Random access memory
--Testing.

LC Class. No.: TK7895.M4 / M476 1996

Dewey Class. No.: 621.39/732

Testing and testable design of high-density random-access memories /
LDR:00654nam 2200181 a 450 001 144554
005 19970109222635.0
008 090528s1996 maua 001 0 eng
010 $a 96027507
020 $a 0792397827 (alk. paper) : $c NT$4,684
035 $a 00005030
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7895.M4 $b M476 1996
082 0 0 $2 20 $a 621.39/732
100 $a Mazumder, Pinaki. $3 185575
245 1 0 $a Testing and testable design of high-density random-access memories / $c by Pinaki Mazumder and Kanad Chakraborty.
260 $a Boston, Mass : $c 1996. $b Kluwer Academic,
300 $a xxxviii, 386 p. : $b ill. ; $c 25 cm.
440 0 $a Frontiers in electronic testing
504 $a Includes bibliographical references (p. [367]-381) and index.
650 $a Random access memory $x Testing. $3 185576
700 $a Chakraborty, Kanad. $3 185574

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