國立高雄大學圖資館 |

Language: English

Back

High performance memory testingdesig...

Adams, R. Dean.

High performance memory testingdesign principles, fault modeling, and self-test /

Record Type:	Electronic resources : Monograph/item
Title/Author:	High performance memory testingR. Dean Adams.
Reminder of title:	design principles, fault modeling, and self-test /
Author:	Adams, R. Dean.
Published:	Boston :Kluwer Academic,c2003.
Description:	xiii, 246 p. :ill., digital ;25 cm.
Series:	Frontiers in electronic testing
Contained By:	Springer e-books
Subject:	Semiconductor storage devicesTesting.
Online resource:	http://dx.doi.org/10.1007/b101876
ISBN:	9780306479724 (electronic bk.)

High performance memory testingdesign principles, fault modeling, and self-test /
Adams, R. Dean.

High performance memory testingdesign principles, fault modeling, and self-test /[electronic resource] :R. Dean Adams. - Boston :Kluwer Academic,c2003. - xiii, 246 p. :ill., digital ;25 cm. - Frontiers in electronic testing.

ISBN: 9780306479724 (electronic bk.)Subjects--Topical Terms:

345116
Semiconductor storage devices
--Testing.

LC Class. No.: TK7895.M4 / A27 2003

Dewey Class. No.: 621.39732

High performance memory testingdesign principles, fault modeling, and self-test /
LDR:00797nmm 2200241 a 4500 001 216686
003 GreenPo
005 20081016103020.0
006 m d
007 cr nn 008maaau
008 091014s2003 mau j eng d
020 $a 9780306479724 (electronic bk.)
020 $a 9781402072550 (paper)
035 $a 978-1-4020-7255-0
050 0 0 $a TK7895.M4 $b A27 2003
082 0 0 $a 621.39732 $2 21
090 $a TK7895.M4 $b A216 2003
100 1 $a Adams, R. Dean. $3 345115
245 1 0 $a High performance memory testing $h [electronic resource] : $b design principles, fault modeling, and self-test / $c R. Dean Adams.
260 $a Boston : $c c2003. $b Kluwer Academic,
300 $a xiii, 246 p. : $b ill., digital ; $c 25 cm.
440 0 $a Frontiers in electronic testing
650 0 $a Semiconductor storage devices $x Testing. $3 345116
650 0 $a Computer storage devices $x Testing. $3 345117
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer e-books
856 4 0 $u http://dx.doi.org/10.1007/b101876
950 $a Engineering