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VLSI design and test22nd Internation...

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VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /

Record Type:	Electronic resources : Monograph/item
Title/Author:	VLSI design and testedited by S. Rajaram ... [et al.].
Reminder of title:	22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
remainder title:	VDAT 2018
other author:	Rajaram, S.
corporate name:
Published:	Singapore :Springer Singapore :2019.
Description:	xviii, 722 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Integrated circuitsCongresses.Very large scale integration
Online resource:	https://doi.org/10.1007/978-981-13-5950-7
ISBN:	9789811359507$q(electronic bk.)

VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /[electronic resource] :VDAT 2018edited by S. Rajaram ... [et al.]. - Singapore :Springer Singapore :2019. - xviii, 722 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,8921865-0929 ;. - Communications in computer and information science ;229..

Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

ISBN: 9789811359507$q(electronic bk.)

Standard No.: 10.1007/978-981-13-5950-7doiSubjects--Topical Terms:

436460
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
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490 1 $a Communications in computer and information science, $x 1865-0929 ; $v 892
505 0 $a Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
520 $a This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
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