Integrated circuits - Congresses. - Very large scale integration - Testing
Overview
| Works: | 8 works in 7 publications in 7 languages | |
|---|---|---|
Titles
2006 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) :proceedings of technical papers, April 26-28, 2006, Ambassador Hotel, Hsinchu, Taiwan /
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(Language materials, printed)
Progress in VLSI design and test16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012 : proceedings /
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(Electronic resources)
VLSI design and test21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
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(Electronic resources)
VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
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(Electronic resources)
VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
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(Electronic resources)
Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
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(Electronic resources)
Emerging VLSI devices, circuits and architecturesproceedings of the 27th International Symposium, VDAT 2023 /
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(Electronic resources)
VLSI for embedded intelligenceproceedings of the 27th International Symposium, VDAT 2023 /
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(Electronic resources)
Subjects