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VLSI design and test22nd Internation...

(1998 :)

VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	VLSI design and testedited by S. Rajaram ... [et al.].
其他題名:	22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
其他題名:	VDAT 2018
其他作者:	Rajaram, S.
團體作者:
出版者:	Singapore :Springer Singapore :2019.
面頁冊數:	xviii, 722 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Integrated circuitsCongresses.Very large scale integration
電子資源:	https://doi.org/10.1007/978-981-13-5950-7
ISBN:	9789811359507$q(electronic bk.)

VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /[electronic resource] :VDAT 2018edited by S. Rajaram ... [et al.]. - Singapore :Springer Singapore :2019. - xviii, 722 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,8921865-0929 ;. - Communications in computer and information science ;229..

Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

ISBN: 9789811359507$q(electronic bk.)

Standard No.: 10.1007/978-981-13-5950-7doiSubjects--Topical Terms:

436460
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

VLSI design and test22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
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