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VLSI design and test23rd Internation...

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VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /

Record Type:	Electronic resources : Monograph/item
Title/Author:	VLSI design and testedited by Anirban Sengupta ... [et al.].
Reminder of title:	23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
remainder title:	VDAT 2019
other author:	Sengupta, Anirban.
corporate name:
Published:	Singapore :Springer Singapore :2019.
Description:	xvi, 775 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Integrated circuitsCongresses.Very large scale integration
Online resource:	https://doi.org/10.1007/978-981-32-9767-8
ISBN:	9789813297678$q(electronic bk.)

VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /[electronic resource] :VDAT 2019edited by Anirban Sengupta ... [et al.]. - Singapore :Springer Singapore :2019. - xvi, 775 p. :ill., digital ;24 cm. - Communications in computer and information science,10661865-0929 ;. - Communications in computer and information science ;229..

Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

ISBN: 9789813297678$q(electronic bk.)

Standard No.: 10.1007/978-981-32-9767-8doiSubjects--Topical Terms:

436460
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75 / .V33 2019

Dewey Class. No.: 621.395

VLSI design and test23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers /
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