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Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Vlsi design and testedited by Ambika Prasad Shah ... [et al.].
Reminder of title:	26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
remainder title:	VDAT 2022
other author:	Shah, Ambika Prasad.
corporate name:
Published:	Cham :Springer Nature Switzerland :2022.
Description:	xviii, 596 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Integrated circuitsCongresses.Very large scale integration
Online resource:	https://doi.org/10.1007/978-3-031-21514-8
ISBN:	9783031215148$q(electronic bk.)

Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /[electronic resource] :VDAT 2022edited by Ambika Prasad Shah ... [et al.]. - Cham :Springer Nature Switzerland :2022. - xviii, 596 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,16871865-0937 ;. - Communications in computer and information science ;229..

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

ISBN: 9783031215148$q(electronic bk.)

Standard No.: 10.1007/978-3-031-21514-8doiSubjects--Topical Terms:

436460
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
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