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Integrated circuits - Very large scale integration - Testing.

概要

作品:	11 作品在 5 項出版品 5 種語言

書目資訊

Digital circuit testing and testability / by: (書目-語言資料,印刷品)

Iddq testing for CMOS VLSI / by: (書目-語言資料,印刷品)

From contamination to defects, faults, and yield loss :simulation and applications / by: (書目-語言資料,印刷品)

Genetic algorithms for VLSI design, layout & test automation / by: (書目-語言資料,印刷品)

VLSI test principles and architectures :design for testability / by: (書目-語言資料,印刷品)

System-on-chip test architecturesnanometer design for testability / by: (書目-電子資源)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (書目-電子資源)

VLSI test principles and architecturesdesign for testability / by: (書目-電子資源)

Debug automation from pre-silicon to post-silicon by: (書目-電子資源)

VLSI design and test for systems dependability by: (書目-電子資源)

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主題

Genetic algorithms.

Mixed signal circuits

Circuits int�egr�es �a tr�es grande �echelle

Integrated circuits / Very large scale integration / Testing.

VLSI.

COMPUTERS

Engineering Design.

Integrated circuits / Very large scale integration / Design.

Control Structures and Microprogramming.

Digital integrated circuits

Processor Architectures.

Circuits and Systems.

Computer-aided design.

TECHNOLOGY & ENGINEERING

Crosstalk.

Performance and Reliability.

Semiconductor storage devices

Circuitos integrados vlsi.

Testen.

Systems and Data Security.

Integrated circuits

Systems on a chip

Electronic Circuits and Devices.

Quality Control, Reliability, Safety and Risk.

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